OPTICAL DEVICE INSPECTION SYSTEM AND METHOD USING A LARGE DEPTH OF FIELD

An optical device inspection system and method employing a narrow aperture on a magnifying objective lens in order to reduce the circle of confusion and increase the depth of field. The smaller aperture resulting in an increase in depth of field allows for simultaneous focus for all portions of obje...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	LEWISON, DAVID, BERGENDAHL, MARC
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	MEASURING PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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