PHOTODETECTION SYSTEM AND CIRCUIT FOR AMLIFICATION
A first device comprising a first current mirror is used to amplify the output of a first photodetector. A second device comprising a current mirror arrangement is employed to amplify the output of a second photodetector. The outputs of the two devices are then compared to provide a signal useful fo...
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| creator | TSANG, KOON, WING KUO, BRIAN, N HSU, PEI-LING LAN, ING-JYE |
| description | A first device comprising a first current mirror is used to amplify the output of a first photodetector. A second device comprising a current mirror arrangement is employed to amplify the output of a second photodetector. The outputs of the two devices are then compared to provide a signal useful for many applications, including that for determining the position of a rotating member or of a member in relative motion to another member. Preferably, no feedback action is used for the amplification of the output of at least one of the photodetectors.
L'invention concerne un premier dispositif comprenant un premier miroir de courant que l'on utilise pour amplifier la sortie d'un premier photodétecteur. On prévoit un second dispositif comprenant un agencement de miroir de courant que l'on utilise pour amplifier la sortie d'un second photodétecteur. Les sorties des deux dispositifs sont ensuite comparées afin d'obtenir un signal servant dans de multiples applications, y compris celles permettant de déterminer la position d'un élément rotatif ou d'un élément en mouvement relatif par rapport à un autre élément. On n'utilise de préférence aucune action de rétroaction pour l'amplification de la sortie d'au moins un des photodétecteurs. |
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L'invention concerne un premier dispositif comprenant un premier miroir de courant que l'on utilise pour amplifier la sortie d'un premier photodétecteur. On prévoit un second dispositif comprenant un agencement de miroir de courant que l'on utilise pour amplifier la sortie d'un second photodétecteur. Les sorties des deux dispositifs sont ensuite comparées afin d'obtenir un signal servant dans de multiples applications, y compris celles permettant de déterminer la position d'un élément rotatif ou d'un élément en mouvement relatif par rapport à un autre élément. On n'utilise de préférence aucune action de rétroaction pour l'amplification de la sortie d'au moins un des photodétecteurs.</description><edition>7</edition><language>eng ; fre</language><subject>AMPLIFIERS ; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; BASIC ELECTRIC ELEMENTS ; BASIC ELECTRONIC CIRCUITRY ; COLORIMETRY ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; RADIATION PYROMETRY ; SEMICONDUCTOR DEVICES ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2004</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20040108&DB=EPODOC&CC=WO&NR=2004003481A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20040108&DB=EPODOC&CC=WO&NR=2004003481A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TSANG, KOON, WING</creatorcontrib><creatorcontrib>KUO, BRIAN, N</creatorcontrib><creatorcontrib>HSU, PEI-LING</creatorcontrib><creatorcontrib>LAN, ING-JYE</creatorcontrib><title>PHOTODETECTION SYSTEM AND CIRCUIT FOR AMLIFICATION</title><description>A first device comprising a first current mirror is used to amplify the output of a first photodetector. A second device comprising a current mirror arrangement is employed to amplify the output of a second photodetector. The outputs of the two devices are then compared to provide a signal useful for many applications, including that for determining the position of a rotating member or of a member in relative motion to another member. Preferably, no feedback action is used for the amplification of the output of at least one of the photodetectors.
L'invention concerne un premier dispositif comprenant un premier miroir de courant que l'on utilise pour amplifier la sortie d'un premier photodétecteur. On prévoit un second dispositif comprenant un agencement de miroir de courant que l'on utilise pour amplifier la sortie d'un second photodétecteur. Les sorties des deux dispositifs sont ensuite comparées afin d'obtenir un signal servant dans de multiples applications, y compris celles permettant de déterminer la position d'un élément rotatif ou d'un élément en mouvement relatif par rapport à un autre élément. On n'utilise de préférence aucune action de rétroaction pour l'amplification de la sortie d'au moins un des photodétecteurs.</description><subject>AMPLIFIERS</subject><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>COLORIMETRY</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2004</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDAK8PAP8XdxDXF1DvH091MIjgwOcfVVcPRzUXD2DHIO9QxRcPMPUnD09fF083R2BKnhYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXx4f5GBgYmBgbGJhaGjobGxKkCAC6dJ-A</recordid><startdate>20040108</startdate><enddate>20040108</enddate><creator>TSANG, KOON, WING</creator><creator>KUO, BRIAN, N</creator><creator>HSU, PEI-LING</creator><creator>LAN, ING-JYE</creator><scope>EVB</scope></search><sort><creationdate>20040108</creationdate><title>PHOTODETECTION SYSTEM AND CIRCUIT FOR AMLIFICATION</title><author>TSANG, KOON, WING ; KUO, BRIAN, N ; HSU, PEI-LING ; LAN, ING-JYE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2004003481A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2004</creationdate><topic>AMPLIFIERS</topic><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>COLORIMETRY</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TSANG, KOON, WING</creatorcontrib><creatorcontrib>KUO, BRIAN, N</creatorcontrib><creatorcontrib>HSU, PEI-LING</creatorcontrib><creatorcontrib>LAN, ING-JYE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TSANG, KOON, WING</au><au>KUO, BRIAN, N</au><au>HSU, PEI-LING</au><au>LAN, ING-JYE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PHOTODETECTION SYSTEM AND CIRCUIT FOR AMLIFICATION</title><date>2004-01-08</date><risdate>2004</risdate><abstract>A first device comprising a first current mirror is used to amplify the output of a first photodetector. A second device comprising a current mirror arrangement is employed to amplify the output of a second photodetector. The outputs of the two devices are then compared to provide a signal useful for many applications, including that for determining the position of a rotating member or of a member in relative motion to another member. Preferably, no feedback action is used for the amplification of the output of at least one of the photodetectors.
L'invention concerne un premier dispositif comprenant un premier miroir de courant que l'on utilise pour amplifier la sortie d'un premier photodétecteur. On prévoit un second dispositif comprenant un agencement de miroir de courant que l'on utilise pour amplifier la sortie d'un second photodétecteur. Les sorties des deux dispositifs sont ensuite comparées afin d'obtenir un signal servant dans de multiples applications, y compris celles permettant de déterminer la position d'un élément rotatif ou d'un élément en mouvement relatif par rapport à un autre élément. On n'utilise de préférence aucune action de rétroaction pour l'amplification de la sortie d'au moins un des photodétecteurs.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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| subjects | AMPLIFIERS ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS BASIC ELECTRIC ELEMENTS BASIC ELECTRONIC CIRCUITRY COLORIMETRY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS RADIATION PYROMETRY SEMICONDUCTOR DEVICES TARIFF METERING APPARATUS TESTING |
| title | PHOTODETECTION SYSTEM AND CIRCUIT FOR AMLIFICATION |
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