METHOD AND APPARATUS FOR EFFICIENT SEMICONDUCTOR PROCESS EVALUATION

A method is described that involves automatically generating an Physical behavior curve from a process description; where, the process description describes a process. The method also involves automatically generating a device model for the process from the Physical behavior curve; where, the device...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	HEYDLER, THOMAS
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
Online-Zugang:	Volltext bestellen
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