METHOD OF MONITORING EXTENT OF CURE OF A COATING
Method of measuring extent of cure of a coating comprising operating a metal-containing substrate coating operation to provide a coated metal-containing substrate; positioning an investigative apparatus near the coated metal-containing substrate; and operating the investigative apparatus to obtain a...
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| creator | NIEDERST, JEFFREY NEUBAUER, CHRISTOPHER, M RIDDLE, DAVID, M KUBALA, JEFFREY, R |
| description | Method of measuring extent of cure of a coating comprising operating a metal-containing substrate coating operation to provide a coated metal-containing substrate; positioning an investigative apparatus near the coated metal-containing substrate; and operating the investigative apparatus to obtain an extent of cure reading, the reading corresponding to an area on the coated metal-containing substrate. Areas on metal-containing substrate with an unacceptable extent of cure reading may be identified, and a process variable of the coating operation modified. The investigative apparatus may be a spectroscopic probe.
L'invention concerne un procédé de mesure de l'étendue de cuisson d'un revêtement qui consiste à réaliser une opération de revêtement d'un substrat contenant du métal destinée à produire un substrat revêtu contenant du métal; à placer un appareil d'analyse à proximité du substrat contenant du métal; et à faire fonctionner ledit appareil pour obtenir une étendue de l'indication de cuisson, ladite indication correspondant à une zone sur le substrat revêtu contenant du métal. |
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L'invention concerne un procédé de mesure de l'étendue de cuisson d'un revêtement qui consiste à réaliser une opération de revêtement d'un substrat contenant du métal destinée à produire un substrat revêtu contenant du métal; à placer un appareil d'analyse à proximité du substrat contenant du métal; et à faire fonctionner ledit appareil pour obtenir une étendue de l'indication de cuisson, ladite indication correspondant à une zone sur le substrat revêtu contenant du métal.</description><edition>7</edition><language>eng ; fre</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2003</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20031113&DB=EPODOC&CC=WO&NR=03034042A3$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25569,76552</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20031113&DB=EPODOC&CC=WO&NR=03034042A3$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NIEDERST, JEFFREY</creatorcontrib><creatorcontrib>NEUBAUER, CHRISTOPHER, M</creatorcontrib><creatorcontrib>RIDDLE, DAVID, M</creatorcontrib><creatorcontrib>KUBALA, JEFFREY, R</creatorcontrib><title>METHOD OF MONITORING EXTENT OF CURE OF A COATING</title><description>Method of measuring extent of cure of a coating comprising operating a metal-containing substrate coating operation to provide a coated metal-containing substrate; positioning an investigative apparatus near the coated metal-containing substrate; and operating the investigative apparatus to obtain an extent of cure reading, the reading corresponding to an area on the coated metal-containing substrate. Areas on metal-containing substrate with an unacceptable extent of cure reading may be identified, and a process variable of the coating operation modified. The investigative apparatus may be a spectroscopic probe.
L'invention concerne un procédé de mesure de l'étendue de cuisson d'un revêtement qui consiste à réaliser une opération de revêtement d'un substrat contenant du métal destinée à produire un substrat revêtu contenant du métal; à placer un appareil d'analyse à proximité du substrat contenant du métal; et à faire fonctionner ledit appareil pour obtenir une étendue de l'indication de cuisson, ladite indication correspondant à une zone sur le substrat revêtu contenant du métal.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2003</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDDwdQ3x8HdR8HdT8PX38wzxD_L0c1dwjQhx9QsBCTqHBrmCaEcFZ3_HEKAcDwNrWmJOcSovlOZmUHRzDXH20E0tyI9PLS5ITE7NSy2JD_c3MDYwNjEwMXI0NiZGDQAMyiX6</recordid><startdate>20031113</startdate><enddate>20031113</enddate><creator>NIEDERST, JEFFREY</creator><creator>NEUBAUER, CHRISTOPHER, M</creator><creator>RIDDLE, DAVID, M</creator><creator>KUBALA, JEFFREY, R</creator><scope>EVB</scope></search><sort><creationdate>20031113</creationdate><title>METHOD OF MONITORING EXTENT OF CURE OF A COATING</title><author>NIEDERST, JEFFREY ; NEUBAUER, CHRISTOPHER, M ; RIDDLE, DAVID, M ; KUBALA, JEFFREY, R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO03034042A33</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2003</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NIEDERST, JEFFREY</creatorcontrib><creatorcontrib>NEUBAUER, CHRISTOPHER, M</creatorcontrib><creatorcontrib>RIDDLE, DAVID, M</creatorcontrib><creatorcontrib>KUBALA, JEFFREY, R</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NIEDERST, JEFFREY</au><au>NEUBAUER, CHRISTOPHER, M</au><au>RIDDLE, DAVID, M</au><au>KUBALA, JEFFREY, R</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD OF MONITORING EXTENT OF CURE OF A COATING</title><date>2003-11-13</date><risdate>2003</risdate><abstract>Method of measuring extent of cure of a coating comprising operating a metal-containing substrate coating operation to provide a coated metal-containing substrate; positioning an investigative apparatus near the coated metal-containing substrate; and operating the investigative apparatus to obtain an extent of cure reading, the reading corresponding to an area on the coated metal-containing substrate. Areas on metal-containing substrate with an unacceptable extent of cure reading may be identified, and a process variable of the coating operation modified. The investigative apparatus may be a spectroscopic probe.
L'invention concerne un procédé de mesure de l'étendue de cuisson d'un revêtement qui consiste à réaliser une opération de revêtement d'un substrat contenant du métal destinée à produire un substrat revêtu contenant du métal; à placer un appareil d'analyse à proximité du substrat contenant du métal; et à faire fonctionner ledit appareil pour obtenir une étendue de l'indication de cuisson, ladite indication correspondant à une zone sur le substrat revêtu contenant du métal.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | METHOD OF MONITORING EXTENT OF CURE OF A COATING |
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