MICRO CONNECTOR TO FACILITATE TESTING OF MICRO ELECTRONIC COMPONENT AND SUBASSEMBLIES

A testing apparatus (40) which includes a contact connector comprising a housing (42) with contact blades (43) extending from the housing (42). The contact blades (43) are pivotably mounted to the housing (42) by pivot rods (44). A biasing element (57) coupled to the contact blades (43) providing re...

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Bibliographische Detailangaben
Hauptverfasser:	HILLE, RYAN, SCHHUSTER, PHILIP, J, HAMES, JEFFREY, L
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	BASIC ELECTRIC ELEMENTS CURRENT COLLECTORS ELECTRICITY LINE CONNECTORS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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