MEHTHOD AND DEVICE FOR MEASURING THREE-DIMENSIONAL SHAPES
A method and apparatus to digitize three-dimensional objects. A projection assembly is retained in fixed relation to an imaging assembly. The projection assembly projects a fixed gradient light pattern into a focal zone of the imaging assembly. The imaging assembly integrates the illumination over t...
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| creator | KNIGHTON, MARK, S DROBNIS, DAVID, D MCKINLEY, WILLIAM, D ZHENG, JOHN, Z LOGAN, J., DOUGLAS DIACONESCU, PETER, L VUONG, KEVIN, H HAYNIE, JILL, E AGABRA, DAVID, S TANDON, AMIT SIDNEY, KENT, E BAHHOUR, BASEL, F |
| description | A method and apparatus to digitize three-dimensional objects. A projection assembly is retained in fixed relation to an imaging assembly. The projection assembly projects a fixed gradient light pattern into a focal zone of the imaging assembly. The imaging assembly integrates the illumination over time such that the fixed gradient reveals the features of the three dimensional object. In one embodiment, depth detection is possible on a per pixel basis.
L'invention concerne un procédé et un dispositif destinés à numériser des objets tridimensionnels. Une unité de projection est maintenue fixe par rapport à une unité d'imagerie. Cette unité de projection permet de projeter un motif lumineux à gradient fixe dans une zone focale de l'unité d'imagerie. Ladite unité d'imagerie intègre progressivement l'éclairement de façon que le gradient fixe fournisse une indication sur les caractéristiques de l'objet tridimensionnel. Dans un mode de réalisation, on peut effectuer une détection en profondeur pixel par pixel. |
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L'invention concerne un procédé et un dispositif destinés à numériser des objets tridimensionnels. Une unité de projection est maintenue fixe par rapport à une unité d'imagerie. Cette unité de projection permet de projeter un motif lumineux à gradient fixe dans une zone focale de l'unité d'imagerie. Ladite unité d'imagerie intègre progressivement l'éclairement de façon que le gradient fixe fournisse une indication sur les caractéristiques de l'objet tridimensionnel. Dans un mode de réalisation, on peut effectuer une détection en profondeur pixel par pixel.</description><edition>7</edition><language>eng ; fre</language><subject>CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2003</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20030206&DB=EPODOC&CC=WO&NR=0223918A3$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20030206&DB=EPODOC&CC=WO&NR=0223918A3$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KNIGHTON, MARK, S</creatorcontrib><creatorcontrib>DROBNIS, DAVID, D</creatorcontrib><creatorcontrib>MCKINLEY, WILLIAM, D</creatorcontrib><creatorcontrib>ZHENG, JOHN, Z</creatorcontrib><creatorcontrib>LOGAN, J., DOUGLAS</creatorcontrib><creatorcontrib>DIACONESCU, PETER, L</creatorcontrib><creatorcontrib>VUONG, KEVIN, H</creatorcontrib><creatorcontrib>HAYNIE, JILL, E</creatorcontrib><creatorcontrib>AGABRA, DAVID, S</creatorcontrib><creatorcontrib>TANDON, AMIT</creatorcontrib><creatorcontrib>SIDNEY, KENT, E</creatorcontrib><creatorcontrib>BAHHOUR, BASEL, F</creatorcontrib><title>MEHTHOD AND DEVICE FOR MEASURING THREE-DIMENSIONAL SHAPES</title><description>A method and apparatus to digitize three-dimensional objects. A projection assembly is retained in fixed relation to an imaging assembly. The projection assembly projects a fixed gradient light pattern into a focal zone of the imaging assembly. The imaging assembly integrates the illumination over time such that the fixed gradient reveals the features of the three dimensional object. In one embodiment, depth detection is possible on a per pixel basis.
L'invention concerne un procédé et un dispositif destinés à numériser des objets tridimensionnels. Une unité de projection est maintenue fixe par rapport à une unité d'imagerie. Cette unité de projection permet de projeter un motif lumineux à gradient fixe dans une zone focale de l'unité d'imagerie. Ladite unité d'imagerie intègre progressivement l'éclairement de façon que le gradient fixe fournisse une indication sur les caractéristiques de l'objet tridimensionnel. Dans un mode de réalisation, on peut effectuer une détection en profondeur pixel par pixel.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2003</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLD0dfUI8fB3UXD0c1FwcQ3zdHZVcPMPUvB1dQwODfL0c1cI8QhyddV18fR19Qv29Pdz9FEI9nAMcA3mYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXx4f4GRkbGloYWjsbGRCgBAC15KFo</recordid><startdate>20030206</startdate><enddate>20030206</enddate><creator>KNIGHTON, MARK, S</creator><creator>DROBNIS, DAVID, D</creator><creator>MCKINLEY, WILLIAM, D</creator><creator>ZHENG, JOHN, Z</creator><creator>LOGAN, J., DOUGLAS</creator><creator>DIACONESCU, PETER, L</creator><creator>VUONG, KEVIN, H</creator><creator>HAYNIE, JILL, E</creator><creator>AGABRA, DAVID, S</creator><creator>TANDON, AMIT</creator><creator>SIDNEY, KENT, E</creator><creator>BAHHOUR, BASEL, F</creator><scope>EVB</scope></search><sort><creationdate>20030206</creationdate><title>MEHTHOD AND DEVICE FOR MEASURING THREE-DIMENSIONAL SHAPES</title><author>KNIGHTON, MARK, S ; DROBNIS, DAVID, D ; MCKINLEY, WILLIAM, D ; ZHENG, JOHN, Z ; LOGAN, J., DOUGLAS ; DIACONESCU, PETER, L ; VUONG, KEVIN, H ; HAYNIE, JILL, E ; AGABRA, DAVID, S ; TANDON, AMIT ; SIDNEY, KENT, E ; BAHHOUR, BASEL, F</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO0223918A33</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2003</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KNIGHTON, MARK, S</creatorcontrib><creatorcontrib>DROBNIS, DAVID, D</creatorcontrib><creatorcontrib>MCKINLEY, WILLIAM, D</creatorcontrib><creatorcontrib>ZHENG, JOHN, Z</creatorcontrib><creatorcontrib>LOGAN, J., DOUGLAS</creatorcontrib><creatorcontrib>DIACONESCU, PETER, L</creatorcontrib><creatorcontrib>VUONG, KEVIN, H</creatorcontrib><creatorcontrib>HAYNIE, JILL, E</creatorcontrib><creatorcontrib>AGABRA, DAVID, S</creatorcontrib><creatorcontrib>TANDON, AMIT</creatorcontrib><creatorcontrib>SIDNEY, KENT, E</creatorcontrib><creatorcontrib>BAHHOUR, BASEL, F</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KNIGHTON, MARK, S</au><au>DROBNIS, DAVID, D</au><au>MCKINLEY, WILLIAM, D</au><au>ZHENG, JOHN, Z</au><au>LOGAN, J., DOUGLAS</au><au>DIACONESCU, PETER, L</au><au>VUONG, KEVIN, H</au><au>HAYNIE, JILL, E</au><au>AGABRA, DAVID, S</au><au>TANDON, AMIT</au><au>SIDNEY, KENT, E</au><au>BAHHOUR, BASEL, F</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MEHTHOD AND DEVICE FOR MEASURING THREE-DIMENSIONAL SHAPES</title><date>2003-02-06</date><risdate>2003</risdate><abstract>A method and apparatus to digitize three-dimensional objects. A projection assembly is retained in fixed relation to an imaging assembly. The projection assembly projects a fixed gradient light pattern into a focal zone of the imaging assembly. The imaging assembly integrates the illumination over time such that the fixed gradient reveals the features of the three dimensional object. In one embodiment, depth detection is possible on a per pixel basis.
L'invention concerne un procédé et un dispositif destinés à numériser des objets tridimensionnels. Une unité de projection est maintenue fixe par rapport à une unité d'imagerie. Cette unité de projection permet de projeter un motif lumineux à gradient fixe dans une zone focale de l'unité d'imagerie. Ladite unité d'imagerie intègre progressivement l'éclairement de façon que le gradient fixe fournisse une indication sur les caractéristiques de l'objet tridimensionnel. Dans un mode de réalisation, on peut effectuer une détection en profondeur pixel par pixel.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | MEHTHOD AND DEVICE FOR MEASURING THREE-DIMENSIONAL SHAPES |
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