ENHANCING SURFACES FOR ANALYTE DETECTION
This invention comprises devices and methods for increasing the sensitivity of detection of analytes. Analytes are placed near enhancing structures on a substrate. The enhancing structures include fractal particle aggregates made of metals such as gold and silver. Analytes can be concentrated near e...
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| creator | KREIMER, DAVID, I NUFERT, THOMAS, H |
| description | This invention comprises devices and methods for increasing the sensitivity of detection of analytes. Analytes are placed near enhancing structures on a substrate. The enhancing structures include fractal particle aggregates made of metals such as gold and silver. Analytes can be concentrated near enhancing structures using methods including spin-concentration, electroconcentration, and/or affinity methods. Affinity methods include hydrophobic (non-polar) interaction and hydrophilic (polar) interaction. By selecting appropriate substrate, enhancing structure, solvent and analyte, the devices and methods of this invention can increase the sensitivity of detection and quantitation of analytes using electromagnetic spectroscopy, including Raman spectroscopy.
L'invention concerne des dispositifs et des procédés permettant d'améliorer la sensibilité de détection d'analysats, lesquels sont placés à proximité de structures d'optimisation sur un substrat. Ces structures comprennent des agrégats de particules de dimension fractale, à base de métaux du type or ou argent. On peut concentrer les analysats à proximité des structures en question par le biais de procédés visant à induire la concentration-centrifugation ainsi que l'électroconcentration, et/ou par le biais de procédés reposant sur l'affinité (par exemple, interaction hydrophobe (non polaire) et interaction hydrophile (polaire)). A partir du choix approprié de substrat, de solvant et d'analysat, les dispositifs et les procédés décrits permettent d'améliorer la sensibilité de détection et d'analyse quantitative d'analysats en spectroscopie électromagnétique, y compris la spectroscopie Raman. |
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L'invention concerne des dispositifs et des procédés permettant d'améliorer la sensibilité de détection d'analysats, lesquels sont placés à proximité de structures d'optimisation sur un substrat. Ces structures comprennent des agrégats de particules de dimension fractale, à base de métaux du type or ou argent. On peut concentrer les analysats à proximité des structures en question par le biais de procédés visant à induire la concentration-centrifugation ainsi que l'électroconcentration, et/ou par le biais de procédés reposant sur l'affinité (par exemple, interaction hydrophobe (non polaire) et interaction hydrophile (polaire)). A partir du choix approprié de substrat, de solvant et d'analysat, les dispositifs et les procédés décrits permettent d'améliorer la sensibilité de détection et d'analyse quantitative d'analysats en spectroscopie électromagnétique, y compris la spectroscopie Raman.</description><edition>7</edition><language>eng ; fre</language><subject>CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PERFORMING OPERATIONS ; PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL ; PHYSICS ; TESTING ; TRANSPORTING</subject><creationdate>2002</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20020926&DB=EPODOC&CC=WO&NR=02074899A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25547,76298</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20020926&DB=EPODOC&CC=WO&NR=02074899A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KREIMER, DAVID, I</creatorcontrib><creatorcontrib>NUFERT, THOMAS, H</creatorcontrib><title>ENHANCING SURFACES FOR ANALYTE DETECTION</title><description>This invention comprises devices and methods for increasing the sensitivity of detection of analytes. Analytes are placed near enhancing structures on a substrate. The enhancing structures include fractal particle aggregates made of metals such as gold and silver. Analytes can be concentrated near enhancing structures using methods including spin-concentration, electroconcentration, and/or affinity methods. Affinity methods include hydrophobic (non-polar) interaction and hydrophilic (polar) interaction. By selecting appropriate substrate, enhancing structure, solvent and analyte, the devices and methods of this invention can increase the sensitivity of detection and quantitation of analytes using electromagnetic spectroscopy, including Raman spectroscopy.
L'invention concerne des dispositifs et des procédés permettant d'améliorer la sensibilité de détection d'analysats, lesquels sont placés à proximité de structures d'optimisation sur un substrat. Ces structures comprennent des agrégats de particules de dimension fractale, à base de métaux du type or ou argent. On peut concentrer les analysats à proximité des structures en question par le biais de procédés visant à induire la concentration-centrifugation ainsi que l'électroconcentration, et/ou par le biais de procédés reposant sur l'affinité (par exemple, interaction hydrophobe (non polaire) et interaction hydrophile (polaire)). A partir du choix approprié de substrat, de solvant et d'analysat, les dispositifs et les procédés décrits permettent d'améliorer la sensibilité de détection et d'analyse quantitative d'analysats en spectroscopie électromagnétique, y compris la spectroscopie Raman.</description><subject>CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2002</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNBw9fNw9HP29HNXCA4NcnN0dg1WcPMPUnD0c_SJDHFVcHENcXUO8fT342FgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8eH-BkYG5iYWlpaOhsbEqAEACU4kRA</recordid><startdate>20020926</startdate><enddate>20020926</enddate><creator>KREIMER, DAVID, I</creator><creator>NUFERT, THOMAS, H</creator><scope>EVB</scope></search><sort><creationdate>20020926</creationdate><title>ENHANCING SURFACES FOR ANALYTE DETECTION</title><author>KREIMER, DAVID, I ; NUFERT, THOMAS, H</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO02074899A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2002</creationdate><topic>CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KREIMER, DAVID, I</creatorcontrib><creatorcontrib>NUFERT, THOMAS, H</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KREIMER, DAVID, I</au><au>NUFERT, THOMAS, H</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ENHANCING SURFACES FOR ANALYTE DETECTION</title><date>2002-09-26</date><risdate>2002</risdate><abstract>This invention comprises devices and methods for increasing the sensitivity of detection of analytes. Analytes are placed near enhancing structures on a substrate. The enhancing structures include fractal particle aggregates made of metals such as gold and silver. Analytes can be concentrated near enhancing structures using methods including spin-concentration, electroconcentration, and/or affinity methods. Affinity methods include hydrophobic (non-polar) interaction and hydrophilic (polar) interaction. By selecting appropriate substrate, enhancing structure, solvent and analyte, the devices and methods of this invention can increase the sensitivity of detection and quantitation of analytes using electromagnetic spectroscopy, including Raman spectroscopy.
L'invention concerne des dispositifs et des procédés permettant d'améliorer la sensibilité de détection d'analysats, lesquels sont placés à proximité de structures d'optimisation sur un substrat. Ces structures comprennent des agrégats de particules de dimension fractale, à base de métaux du type or ou argent. On peut concentrer les analysats à proximité des structures en question par le biais de procédés visant à induire la concentration-centrifugation ainsi que l'électroconcentration, et/ou par le biais de procédés reposant sur l'affinité (par exemple, interaction hydrophobe (non polaire) et interaction hydrophile (polaire)). A partir du choix approprié de substrat, de solvant et d'analysat, les dispositifs et les procédés décrits permettent d'améliorer la sensibilité de détection et d'analyse quantitative d'analysats en spectroscopie électromagnétique, y compris la spectroscopie Raman.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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| subjects | CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PERFORMING OPERATIONS PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL PHYSICS TESTING TRANSPORTING |
| title | ENHANCING SURFACES FOR ANALYTE DETECTION |
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