TWO-DIMENSIONAL SCATTER PLOT TECHNIQUE FOR DEFECT INSPECTION
A method and associated apparatus for relating a test image with a reference image in an automated image processing system is disclosed. The test and reference images are aligned. A two-dimensional scatter plot is then created by plotting the gray level of a test image pixel against the gray level o...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Patent |
| Sprache: | eng ; fre |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | AGHAJAN, HAMID, K |
| description | A method and associated apparatus for relating a test image with a reference image in an automated image processing system is disclosed. The test and reference images are aligned. A two-dimensional scatter plot is then created by plotting the gray level of a test image pixel against the gray level of a corresponding reference image pixel for each aligned pixel location.
L'invention concerne un procédé et un appareil associé, destinés à relier une image test à une image de référence dans un système de traitement image automatisé. Les images test et de référence sont alignées. Un diagramme de dispersion bidimensionnel est alors établi en reportant le niveau de gris d'un pixel image test à l'encontre du niveau de gris d'un pixel image de référence correspondante pour chaque emplacement de pixels alignés. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_WO0180182A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>WO0180182A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_WO0180182A13</originalsourceid><addsrcrecordid>eNrjZLAJCffXdfH0dfUL9vT3c_RRCHZ2DAlxDVII8PEPUQhxdfbw8wwMdVVw8w9ScHF1c3UOUfD0Cw4A0kDlPAysaYk5xam8UJqbQcHNNcTZQze1ID8-tbggMTk1L7UkPtzfwNACiIwcDY2JUAIA1QUpeA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>TWO-DIMENSIONAL SCATTER PLOT TECHNIQUE FOR DEFECT INSPECTION</title><source>esp@cenet</source><creator>AGHAJAN, HAMID, K</creator><creatorcontrib>AGHAJAN, HAMID, K</creatorcontrib><description>A method and associated apparatus for relating a test image with a reference image in an automated image processing system is disclosed. The test and reference images are aligned. A two-dimensional scatter plot is then created by plotting the gray level of a test image pixel against the gray level of a corresponding reference image pixel for each aligned pixel location.
L'invention concerne un procédé et un appareil associé, destinés à relier une image test à une image de référence dans un système de traitement image automatisé. Les images test et de référence sont alignées. Un diagramme de dispersion bidimensionnel est alors établi en reportant le niveau de gris d'un pixel image test à l'encontre du niveau de gris d'un pixel image de référence correspondante pour chaque emplacement de pixels alignés.</description><edition>7</edition><language>eng ; fre</language><subject>BASIC ELECTRIC ELEMENTS ; CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; PHYSICS ; SEMICONDUCTOR DEVICES</subject><creationdate>2001</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20011025&DB=EPODOC&CC=WO&NR=0180182A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20011025&DB=EPODOC&CC=WO&NR=0180182A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>AGHAJAN, HAMID, K</creatorcontrib><title>TWO-DIMENSIONAL SCATTER PLOT TECHNIQUE FOR DEFECT INSPECTION</title><description>A method and associated apparatus for relating a test image with a reference image in an automated image processing system is disclosed. The test and reference images are aligned. A two-dimensional scatter plot is then created by plotting the gray level of a test image pixel against the gray level of a corresponding reference image pixel for each aligned pixel location.
L'invention concerne un procédé et un appareil associé, destinés à relier une image test à une image de référence dans un système de traitement image automatisé. Les images test et de référence sont alignées. Un diagramme de dispersion bidimensionnel est alors établi en reportant le niveau de gris d'un pixel image test à l'encontre du niveau de gris d'un pixel image de référence correspondante pour chaque emplacement de pixels alignés.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2001</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLAJCffXdfH0dfUL9vT3c_RRCHZ2DAlxDVII8PEPUQhxdfbw8wwMdVVw8w9ScHF1c3UOUfD0Cw4A0kDlPAysaYk5xam8UJqbQcHNNcTZQze1ID8-tbggMTk1L7UkPtzfwNACiIwcDY2JUAIA1QUpeA</recordid><startdate>20011025</startdate><enddate>20011025</enddate><creator>AGHAJAN, HAMID, K</creator><scope>EVB</scope></search><sort><creationdate>20011025</creationdate><title>TWO-DIMENSIONAL SCATTER PLOT TECHNIQUE FOR DEFECT INSPECTION</title><author>AGHAJAN, HAMID, K</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO0180182A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2001</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>AGHAJAN, HAMID, K</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>AGHAJAN, HAMID, K</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>TWO-DIMENSIONAL SCATTER PLOT TECHNIQUE FOR DEFECT INSPECTION</title><date>2001-10-25</date><risdate>2001</risdate><abstract>A method and associated apparatus for relating a test image with a reference image in an automated image processing system is disclosed. The test and reference images are aligned. A two-dimensional scatter plot is then created by plotting the gray level of a test image pixel against the gray level of a corresponding reference image pixel for each aligned pixel location.
L'invention concerne un procédé et un appareil associé, destinés à relier une image test à une image de référence dans un système de traitement image automatisé. Les images test et de référence sont alignées. Un diagramme de dispersion bidimensionnel est alors établi en reportant le niveau de gris d'un pixel image test à l'encontre du niveau de gris d'un pixel image de référence correspondante pour chaque emplacement de pixels alignés.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng ; fre |
| recordid | cdi_epo_espacenet_WO0180182A1 |
| source | esp@cenet |
| subjects | BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS SEMICONDUCTOR DEVICES |
| title | TWO-DIMENSIONAL SCATTER PLOT TECHNIQUE FOR DEFECT INSPECTION |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T23%3A16%3A17IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=AGHAJAN,%20HAMID,%20K&rft.date=2001-10-25&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EWO0180182A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |