HIGH RESOLUTION NON-CONTACT INTERIOR PROFILOMETER
Apparatus and method for inspecting the interior surfaces of devices (16) such as vessels having a single entry port. Laser energy is launched into the vessel, and the light reflected from the interior surfaces is interfered with reference laser energy to produce an interference pattern. This interf...
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| creator | PILTCH, MARTIN, S PATTERSON, ALAN, R LEECHES, GERALD, W TERI, JR., JOHN, J VAN NIEROP, JOHN |
| description | Apparatus and method for inspecting the interior surfaces of devices (16) such as vessels having a single entry port. Laser energy is launched into the vessel, and the light reflected from the interior surfaces is interfered with reference laser energy to produce an interference pattern. This interference pattern is analyzed to reveal information about the condition of the interior surfaces of the device (16) inspected.
Cette invention a trait à un appareil et à une technique d'inspection des surfaces internes de dispositifs (16), notamment des cuves ayant un seul orifice d'entrée. De l'énergie laser est envoyée dans la cuve et la lumière réfléchie par les surfaces internes est interférée par l'énergie d'un laser de référence de manière à produire une configuration d'interférence. L'analyse de cette configuration d'interférence donne des informations concernant l'état des surfaces internes du dispositif (16) inspecté. |
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Cette invention a trait à un appareil et à une technique d'inspection des surfaces internes de dispositifs (16), notamment des cuves ayant un seul orifice d'entrée. De l'énergie laser est envoyée dans la cuve et la lumière réfléchie par les surfaces internes est interférée par l'énergie d'un laser de référence de manière à produire une configuration d'interférence. L'analyse de cette configuration d'interférence donne des informations concernant l'état des surfaces internes du dispositif (16) inspecté.</description><edition>7</edition><language>eng ; fre</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2000</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20000810&DB=EPODOC&CC=WO&NR=0046571A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20000810&DB=EPODOC&CC=WO&NR=0046571A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>PILTCH, MARTIN, S</creatorcontrib><creatorcontrib>PATTERSON, ALAN, R</creatorcontrib><creatorcontrib>LEECHES, GERALD, W</creatorcontrib><creatorcontrib>TERI, JR., JOHN, J</creatorcontrib><creatorcontrib>VAN NIEROP, JOHN</creatorcontrib><title>HIGH RESOLUTION NON-CONTACT INTERIOR PROFILOMETER</title><description>Apparatus and method for inspecting the interior surfaces of devices (16) such as vessels having a single entry port. Laser energy is launched into the vessel, and the light reflected from the interior surfaces is interfered with reference laser energy to produce an interference pattern. This interference pattern is analyzed to reveal information about the condition of the interior surfaces of the device (16) inspected.
Cette invention a trait à un appareil et à une technique d'inspection des surfaces internes de dispositifs (16), notamment des cuves ayant un seul orifice d'entrée. De l'énergie laser est envoyée dans la cuve et la lumière réfléchie par les surfaces internes est interférée par l'énergie d'un laser de référence de manière à produire une configuration d'interférence. L'analyse de cette configuration d'interférence donne des informations concernant l'état des surfaces internes du dispositif (16) inspecté.</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2000</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDD08HT3UAhyDfb3CQ3x9PdT8PP303X29wtxdA5R8PQLcQ3y9A9SCAjyd_P08fd1BfJ5GFjTEnOKU3mhNDeDgptriLOHbmpBfnxqcUFicmpeakl8uL-BgYmZqbmho6ExEUoANv4mrA</recordid><startdate>20000810</startdate><enddate>20000810</enddate><creator>PILTCH, MARTIN, S</creator><creator>PATTERSON, ALAN, R</creator><creator>LEECHES, GERALD, W</creator><creator>TERI, JR., JOHN, J</creator><creator>VAN NIEROP, JOHN</creator><scope>EVB</scope></search><sort><creationdate>20000810</creationdate><title>HIGH RESOLUTION NON-CONTACT INTERIOR PROFILOMETER</title><author>PILTCH, MARTIN, S ; PATTERSON, ALAN, R ; LEECHES, GERALD, W ; TERI, JR., JOHN, J ; VAN NIEROP, JOHN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO0046571A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2000</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>PILTCH, MARTIN, S</creatorcontrib><creatorcontrib>PATTERSON, ALAN, R</creatorcontrib><creatorcontrib>LEECHES, GERALD, W</creatorcontrib><creatorcontrib>TERI, JR., JOHN, J</creatorcontrib><creatorcontrib>VAN NIEROP, JOHN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>PILTCH, MARTIN, S</au><au>PATTERSON, ALAN, R</au><au>LEECHES, GERALD, W</au><au>TERI, JR., JOHN, J</au><au>VAN NIEROP, JOHN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>HIGH RESOLUTION NON-CONTACT INTERIOR PROFILOMETER</title><date>2000-08-10</date><risdate>2000</risdate><abstract>Apparatus and method for inspecting the interior surfaces of devices (16) such as vessels having a single entry port. Laser energy is launched into the vessel, and the light reflected from the interior surfaces is interfered with reference laser energy to produce an interference pattern. This interference pattern is analyzed to reveal information about the condition of the interior surfaces of the device (16) inspected.
Cette invention a trait à un appareil et à une technique d'inspection des surfaces internes de dispositifs (16), notamment des cuves ayant un seul orifice d'entrée. De l'énergie laser est envoyée dans la cuve et la lumière réfléchie par les surfaces internes est interférée par l'énergie d'un laser de référence de manière à produire une configuration d'interférence. L'analyse de cette configuration d'interférence donne des informations concernant l'état des surfaces internes du dispositif (16) inspecté.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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| subjects | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | HIGH RESOLUTION NON-CONTACT INTERIOR PROFILOMETER |
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