Memory protection circuitry testing and memory scrubbing using memory built-in self-test

A data processing apparatus includes a memory and memory protection circuitry for providing an operational path to the memory during operational use of the memory. A memory built-in self-test controller 34 performs built-in self-test operations upon the memory using either an indirect test access pa...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Harrod, Peter Logan, Becker, Alan Jeremy
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!