Active device array substrate
An active device array substrate includes a substrate, an inspection circuit, pixel structures, a passivation layer, and conductive pads. The substrate has a display area and a peripheral area outside the display area. The inspection circuit is located on the substrate and includes inspection switch...
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| creator | Wang, Hao-Wei Chiang, Chia-Ming |
| description | An active device array substrate includes a substrate, an inspection circuit, pixel structures, a passivation layer, and conductive pads. The substrate has a display area and a peripheral area outside the display area. The inspection circuit is located on the substrate and includes inspection switches, inspection control lines, and inspection traces. Each of the inspection switches is located in the peripheral area and controlled by one of the inspection control lines. Each of the inspection traces is connected to one of the inspection switches and includes a first conductive wire segment and a second conductive wire segment. The second conductive wire segment is connected between the first conductive wire segment and one corresponding inspection switch. An electric conductivity of the second conductive wire segment is lower than an electric conductivity of the first conductive wire segment. |
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The inspection circuit is located on the substrate and includes inspection switches, inspection control lines, and inspection traces. Each of the inspection switches is located in the peripheral area and controlled by one of the inspection control lines. Each of the inspection traces is connected to one of the inspection switches and includes a first conductive wire segment and a second conductive wire segment. The second conductive wire segment is connected between the first conductive wire segment and one corresponding inspection switch. An electric conductivity of the second conductive wire segment is lower than an electric conductivity of the first conductive wire segment.</description><language>eng</language><subject>ADVERTISING ; ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION ; CRYPTOGRAPHY ; DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING ; DISPLAY ; EDUCATION ; FREQUENCY-CHANGING ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; NON-LINEAR OPTICS ; OPTICAL ANALOGUE/DIGITAL CONVERTERS ; OPTICAL LOGIC ELEMENTS ; OPTICS ; PHYSICS ; SEALS ; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF ; TESTING</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180417&DB=EPODOC&CC=US&NR=9947251B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180417&DB=EPODOC&CC=US&NR=9947251B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Wang, Hao-Wei</creatorcontrib><creatorcontrib>Chiang, Chia-Ming</creatorcontrib><title>Active device array substrate</title><description>An active device array substrate includes a substrate, an inspection circuit, pixel structures, a passivation layer, and conductive pads. 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The substrate has a display area and a peripheral area outside the display area. The inspection circuit is located on the substrate and includes inspection switches, inspection control lines, and inspection traces. Each of the inspection switches is located in the peripheral area and controlled by one of the inspection control lines. Each of the inspection traces is connected to one of the inspection switches and includes a first conductive wire segment and a second conductive wire segment. The second conductive wire segment is connected between the first conductive wire segment and one corresponding inspection switch. An electric conductivity of the second conductive wire segment is lower than an electric conductivity of the first conductive wire segment.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | ADVERTISING ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION CRYPTOGRAPHY DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING DISPLAY EDUCATION FREQUENCY-CHANGING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS SEALS TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF TESTING |
| title | Active device array substrate |
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