System and method for determining test coverage

System and method for determining test coverage

A computer-implemented method, computer program product, and system is provided for determining test coverage. In an implementation, a method may include identifying at least one change in source code. The method may also include instrumenting object code of at least one class file associated with a...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Chan, Philip S. P, Hey, Laurence A, Izard, William J, Ponsford, Matthew J
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Chan, Philip S. P
Hey, Laurence A
Izard, William J
Ponsford, Matthew J
description A computer-implemented method, computer program product, and system is provided for determining test coverage. In an implementation, a method may include identifying at least one change in source code. The method may also include instrumenting object code of at least one class file associated with a source file of the source code associated with the identified at least one change. The method may further include testing the instrumented object code with at least one test case. The method may further include generating a coverage report associated with the instrumented object code, wherein the coverage report includes a proportion of the at least one change in the source code covered by the at least one test case.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US9946634B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US9946634B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US9946634B23</originalsourceid><addsrcrecordid>eNrjZNAPriwuSc1VSMxLUchNLcnIT1FIyy9SSEktSS3KzczLzEtXKEktLlFIzi9LLUpMT-VhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfGhwZaWJmZmxiZORsZEKAEA5fkq3A</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>System and method for determining test coverage</title><source>esp@cenet</source><creator>Chan, Philip S. P ; Hey, Laurence A ; Izard, William J ; Ponsford, Matthew J</creator><creatorcontrib>Chan, Philip S. P ; Hey, Laurence A ; Izard, William J ; Ponsford, Matthew J</creatorcontrib><description>A computer-implemented method, computer program product, and system is provided for determining test coverage. In an implementation, a method may include identifying at least one change in source code. The method may also include instrumenting object code of at least one class file associated with a source file of the source code associated with the identified at least one change. The method may further include testing the instrumented object code with at least one test case. The method may further include generating a coverage report associated with the instrumented object code, wherein the coverage report includes a proportion of the at least one change in the source code covered by the at least one test case.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180417&amp;DB=EPODOC&amp;CC=US&amp;NR=9946634B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25551,76302</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180417&amp;DB=EPODOC&amp;CC=US&amp;NR=9946634B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Chan, Philip S. P</creatorcontrib><creatorcontrib>Hey, Laurence A</creatorcontrib><creatorcontrib>Izard, William J</creatorcontrib><creatorcontrib>Ponsford, Matthew J</creatorcontrib><title>System and method for determining test coverage</title><description>A computer-implemented method, computer program product, and system is provided for determining test coverage. In an implementation, a method may include identifying at least one change in source code. The method may also include instrumenting object code of at least one class file associated with a source file of the source code associated with the identified at least one change. The method may further include testing the instrumented object code with at least one test case. The method may further include generating a coverage report associated with the instrumented object code, wherein the coverage report includes a proportion of the at least one change in the source code covered by the at least one test case.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAPriwuSc1VSMxLUchNLcnIT1FIyy9SSEktSS3KzczLzEtXKEktLlFIzi9LLUpMT-VhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfGhwZaWJmZmxiZORsZEKAEA5fkq3A</recordid><startdate>20180417</startdate><enddate>20180417</enddate><creator>Chan, Philip S. P</creator><creator>Hey, Laurence A</creator><creator>Izard, William J</creator><creator>Ponsford, Matthew J</creator><scope>EVB</scope></search><sort><creationdate>20180417</creationdate><title>System and method for determining test coverage</title><author>Chan, Philip S. P ; Hey, Laurence A ; Izard, William J ; Ponsford, Matthew J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US9946634B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2018</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>Chan, Philip S. P</creatorcontrib><creatorcontrib>Hey, Laurence A</creatorcontrib><creatorcontrib>Izard, William J</creatorcontrib><creatorcontrib>Ponsford, Matthew J</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Chan, Philip S. P</au><au>Hey, Laurence A</au><au>Izard, William J</au><au>Ponsford, Matthew J</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>System and method for determining test coverage</title><date>2018-04-17</date><risdate>2018</risdate><abstract>A computer-implemented method, computer program product, and system is provided for determining test coverage. In an implementation, a method may include identifying at least one change in source code. The method may also include instrumenting object code of at least one class file associated with a source file of the source code associated with the identified at least one change. The method may further include testing the instrumented object code with at least one test case. The method may further include generating a coverage report associated with the instrumented object code, wherein the coverage report includes a proportion of the at least one change in the source code covered by the at least one test case.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US9946634B2
source esp@cenet
subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title System and method for determining test coverage
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T19%3A16%3A32IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Chan,%20Philip%20S.%20P&rft.date=2018-04-17&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS9946634B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true