Integrated circuit with secure scan enable

An integrated circuit senses attempts to access security-related data stored in registers connectable into a scan chain when the attempt includes locally and selectively asserting a scan-enable signal at a corresponding branch of the scan-enable tree when the integrated circuit is in a secure functi...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Hao Pingli, Zhang Wanggen
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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