Stage apparatus, lithographic apparatus and method of positioning an object table

A measurement system configured to measure a position dependent signal of an object table, the measurement system including at least one sensor mountable on the object table and a sensor target object mountable on a substantially stationary frame, and a mounting device configured to mount the sensor...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Van Der Pasch Engelbertus Antonius Fransiscus, Jeunink Andre Bernardus, Eussen Emiel Jozef Melanie, Van Leeuwen Robbert Edgar
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A measurement system configured to measure a position dependent signal of an object table, the measurement system including at least one sensor mountable on the object table and a sensor target object mountable on a substantially stationary frame, and a mounting device configured to mount the sensor target object on the substantially stationary frame, wherein the measurement system further includes a compensator configured to compensate movements and/or deformations of the sensor target object with respect to the substantially stationary frame. The compensator may include a passive or an active damper and/or a feedback position controller. In an alternative embodiment, the compensator includes a gripping device which fixes the position of the sensor target object during a high accuracy movement of the movable object.