Method and apparatus for limiting access to an integrated circuit (IC)

A method and apparatus for limiting access to an integrated circuit (IC) upon detection of abnormal conditions is provided. At least one of abnormal voltage detection, abnormal temperature detection, and abnormal clock detection are provided with low power consumption. Both abnormally low and abnorm...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Feddeler James R, Olmos Alfredo, Nagda Miten H, Pietri Stefano
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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