CMOS image sensors with photogate structures and sensing transistors, operation methods thereof, and image processing systems including the same
ACMOS image sensor includes a pixel array having a plurality of pixels. Each of the plurality of pixels includes: a photogate structure configured to be controlled based on a first gate voltage; and a sensing transistor including a charge pocket region formed in a substrate region, the sensing trans...
Gespeichert in:
Hauptverfasser: | , , , , , , , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | Min Dong Ki Jin Young Gu Sul Sang Chul Lee Tae Yon Kim Tae Chan Jung Ju Hwan Lee Kwang Hyun Kim Min Ho Oh Tae Seok |
description | ACMOS image sensor includes a pixel array having a plurality of pixels. Each of the plurality of pixels includes: a photogate structure configured to be controlled based on a first gate voltage; and a sensing transistor including a charge pocket region formed in a substrate region, the sensing transistor being configured to be controlled based on a second gate voltage. Based on the first gate voltage, the photogate structure is configured to integrate charges generated in response to light incident on the substrate region. The sensing transistor is configured to adjust at least one of a threshold voltage of the sensing transistor and a current flow in the sensing transistor according to charges transferred from the photogate structure to the charge pocket region based on a difference between the first gate voltage and the second gate voltage. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US9894301B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US9894301B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US9894301B23</originalsourceid><addsrcrecordid>eNqNjUEKwjAURLtxIeod_gEqqHVhtxbFjbiorktof5tAkx_yfxFv4ZEN0QO4mmGYNzPP3tX1VoOxakBgdEyB4WlEg9ckNCiJsYSplSkgg3Jdahk3gAQVDUskciCPQYkhBxZFU8cgGgNSnyfmu-8DtcgJ5hcLWgbj2nHq0pyOT8riMpv1amRc_XSRwfl0ry5r9NQge9WiQ2kedXko98Vme9wVf1Q-aAhP6Q</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>CMOS image sensors with photogate structures and sensing transistors, operation methods thereof, and image processing systems including the same</title><source>esp@cenet</source><creator>Min Dong Ki ; Jin Young Gu ; Sul Sang Chul ; Lee Tae Yon ; Kim Tae Chan ; Jung Ju Hwan ; Lee Kwang Hyun ; Kim Min Ho ; Oh Tae Seok</creator><creatorcontrib>Min Dong Ki ; Jin Young Gu ; Sul Sang Chul ; Lee Tae Yon ; Kim Tae Chan ; Jung Ju Hwan ; Lee Kwang Hyun ; Kim Min Ho ; Oh Tae Seok</creatorcontrib><description>ACMOS image sensor includes a pixel array having a plurality of pixels. Each of the plurality of pixels includes: a photogate structure configured to be controlled based on a first gate voltage; and a sensing transistor including a charge pocket region formed in a substrate region, the sensing transistor being configured to be controlled based on a second gate voltage. Based on the first gate voltage, the photogate structure is configured to integrate charges generated in response to light incident on the substrate region. The sensing transistor is configured to adjust at least one of a threshold voltage of the sensing transistor and a current flow in the sensing transistor according to charges transferred from the photogate structure to the charge pocket region based on a difference between the first gate voltage and the second gate voltage.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC COMMUNICATION TECHNIQUE ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; PICTORIAL COMMUNICATION, e.g. TELEVISION ; SEMICONDUCTOR DEVICES</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180213&DB=EPODOC&CC=US&NR=9894301B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25566,76549</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180213&DB=EPODOC&CC=US&NR=9894301B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Min Dong Ki</creatorcontrib><creatorcontrib>Jin Young Gu</creatorcontrib><creatorcontrib>Sul Sang Chul</creatorcontrib><creatorcontrib>Lee Tae Yon</creatorcontrib><creatorcontrib>Kim Tae Chan</creatorcontrib><creatorcontrib>Jung Ju Hwan</creatorcontrib><creatorcontrib>Lee Kwang Hyun</creatorcontrib><creatorcontrib>Kim Min Ho</creatorcontrib><creatorcontrib>Oh Tae Seok</creatorcontrib><title>CMOS image sensors with photogate structures and sensing transistors, operation methods thereof, and image processing systems including the same</title><description>ACMOS image sensor includes a pixel array having a plurality of pixels. Each of the plurality of pixels includes: a photogate structure configured to be controlled based on a first gate voltage; and a sensing transistor including a charge pocket region formed in a substrate region, the sensing transistor being configured to be controlled based on a second gate voltage. Based on the first gate voltage, the photogate structure is configured to integrate charges generated in response to light incident on the substrate region. The sensing transistor is configured to adjust at least one of a threshold voltage of the sensing transistor and a current flow in the sensing transistor according to charges transferred from the photogate structure to the charge pocket region based on a difference between the first gate voltage and the second gate voltage.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC COMMUNICATION TECHNIQUE</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>PICTORIAL COMMUNICATION, e.g. TELEVISION</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjUEKwjAURLtxIeod_gEqqHVhtxbFjbiorktof5tAkx_yfxFv4ZEN0QO4mmGYNzPP3tX1VoOxakBgdEyB4WlEg9ckNCiJsYSplSkgg3Jdahk3gAQVDUskciCPQYkhBxZFU8cgGgNSnyfmu-8DtcgJ5hcLWgbj2nHq0pyOT8riMpv1amRc_XSRwfl0ry5r9NQge9WiQ2kedXko98Vme9wVf1Q-aAhP6Q</recordid><startdate>20180213</startdate><enddate>20180213</enddate><creator>Min Dong Ki</creator><creator>Jin Young Gu</creator><creator>Sul Sang Chul</creator><creator>Lee Tae Yon</creator><creator>Kim Tae Chan</creator><creator>Jung Ju Hwan</creator><creator>Lee Kwang Hyun</creator><creator>Kim Min Ho</creator><creator>Oh Tae Seok</creator><scope>EVB</scope></search><sort><creationdate>20180213</creationdate><title>CMOS image sensors with photogate structures and sensing transistors, operation methods thereof, and image processing systems including the same</title><author>Min Dong Ki ; Jin Young Gu ; Sul Sang Chul ; Lee Tae Yon ; Kim Tae Chan ; Jung Ju Hwan ; Lee Kwang Hyun ; Kim Min Ho ; Oh Tae Seok</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US9894301B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2018</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC COMMUNICATION TECHNIQUE</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>PICTORIAL COMMUNICATION, e.g. TELEVISION</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>Min Dong Ki</creatorcontrib><creatorcontrib>Jin Young Gu</creatorcontrib><creatorcontrib>Sul Sang Chul</creatorcontrib><creatorcontrib>Lee Tae Yon</creatorcontrib><creatorcontrib>Kim Tae Chan</creatorcontrib><creatorcontrib>Jung Ju Hwan</creatorcontrib><creatorcontrib>Lee Kwang Hyun</creatorcontrib><creatorcontrib>Kim Min Ho</creatorcontrib><creatorcontrib>Oh Tae Seok</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Min Dong Ki</au><au>Jin Young Gu</au><au>Sul Sang Chul</au><au>Lee Tae Yon</au><au>Kim Tae Chan</au><au>Jung Ju Hwan</au><au>Lee Kwang Hyun</au><au>Kim Min Ho</au><au>Oh Tae Seok</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CMOS image sensors with photogate structures and sensing transistors, operation methods thereof, and image processing systems including the same</title><date>2018-02-13</date><risdate>2018</risdate><abstract>ACMOS image sensor includes a pixel array having a plurality of pixels. Each of the plurality of pixels includes: a photogate structure configured to be controlled based on a first gate voltage; and a sensing transistor including a charge pocket region formed in a substrate region, the sensing transistor being configured to be controlled based on a second gate voltage. Based on the first gate voltage, the photogate structure is configured to integrate charges generated in response to light incident on the substrate region. The sensing transistor is configured to adjust at least one of a threshold voltage of the sensing transistor and a current flow in the sensing transistor according to charges transferred from the photogate structure to the charge pocket region based on a difference between the first gate voltage and the second gate voltage.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_US9894301B2 |
source | esp@cenet |
subjects | BASIC ELECTRIC ELEMENTS ELECTRIC COMMUNICATION TECHNIQUE ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY PICTORIAL COMMUNICATION, e.g. TELEVISION SEMICONDUCTOR DEVICES |
title | CMOS image sensors with photogate structures and sensing transistors, operation methods thereof, and image processing systems including the same |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-18T06%3A00%3A17IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Min%20Dong%20Ki&rft.date=2018-02-13&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS9894301B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |