Methods and system for determining shear angle
A method for determining an actual shear angle between an interior wall and a facesheet of a cellular panel using an imaging system is disclosed. The imaging system may include a radiation source and a detector diametrically opposed to the radiation source. The method may include positioning the cel...
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creator | Thompson Jeffrey G Nansen David S Bulthuis Ronald V Riechers Thomas E |
description | A method for determining an actual shear angle between an interior wall and a facesheet of a cellular panel using an imaging system is disclosed. The imaging system may include a radiation source and a detector diametrically opposed to the radiation source. The method may include positioning the cellular panel at a tilt angle relative to a line extending between the radiation source and the detector, transmitting radiation from the radiation source to the detector through the cellular panel at the tilt angle to obtain an image, measuring a projected shear angle in the obtained image, and determining the actual shear angle between the interior wall and the facesheet using the tilt angle and the projected shear angle. |
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The imaging system may include a radiation source and a detector diametrically opposed to the radiation source. The method may include positioning the cellular panel at a tilt angle relative to a line extending between the radiation source and the detector, transmitting radiation from the radiation source to the detector through the cellular panel at the tilt angle to obtain an image, measuring a projected shear angle in the obtained image, and determining the actual shear angle between the interior wall and the facesheet using the tilt angle and the projected shear angle.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; LAYERED PRODUCTS ; LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT ORNON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PERFORMING OPERATIONS ; PHYSICS ; TESTING ; TRANSPORTING</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180130&DB=EPODOC&CC=US&NR=9880112B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,782,887,25571,76555</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180130&DB=EPODOC&CC=US&NR=9880112B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Thompson Jeffrey G</creatorcontrib><creatorcontrib>Nansen David S</creatorcontrib><creatorcontrib>Bulthuis Ronald V</creatorcontrib><creatorcontrib>Riechers Thomas E</creatorcontrib><title>Methods and system for determining shear angle</title><description>A method for determining an actual shear angle between an interior wall and a facesheet of a cellular panel using an imaging system is disclosed. The imaging system may include a radiation source and a detector diametrically opposed to the radiation source. The method may include positioning the cellular panel at a tilt angle relative to a line extending between the radiation source and the detector, transmitting radiation from the radiation source to the detector through the cellular panel at the tilt angle to obtain an image, measuring a projected shear angle in the obtained image, and determining the actual shear angle between the interior wall and the facesheet using the tilt angle and the projected shear angle.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>LAYERED PRODUCTS</subject><subject>LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT ORNON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNDzTS3JyE8pVkjMS1EoriwuSc1VSMsvUkhJLUktys3My8xLVyjOSE0sAipIz0nlYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxocGWFhYGhoZGTkbGRCgBAKcWKkQ</recordid><startdate>20180130</startdate><enddate>20180130</enddate><creator>Thompson Jeffrey G</creator><creator>Nansen David S</creator><creator>Bulthuis Ronald V</creator><creator>Riechers Thomas E</creator><scope>EVB</scope></search><sort><creationdate>20180130</creationdate><title>Methods and system for determining shear angle</title><author>Thompson Jeffrey G ; Nansen David S ; Bulthuis Ronald V ; Riechers Thomas E</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US9880112B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2018</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>LAYERED PRODUCTS</topic><topic>LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT ORNON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Thompson Jeffrey G</creatorcontrib><creatorcontrib>Nansen David S</creatorcontrib><creatorcontrib>Bulthuis Ronald V</creatorcontrib><creatorcontrib>Riechers Thomas E</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Thompson Jeffrey G</au><au>Nansen David S</au><au>Bulthuis Ronald V</au><au>Riechers Thomas E</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Methods and system for determining shear angle</title><date>2018-01-30</date><risdate>2018</risdate><abstract>A method for determining an actual shear angle between an interior wall and a facesheet of a cellular panel using an imaging system is disclosed. The imaging system may include a radiation source and a detector diametrically opposed to the radiation source. The method may include positioning the cellular panel at a tilt angle relative to a line extending between the radiation source and the detector, transmitting radiation from the radiation source to the detector through the cellular panel at the tilt angle to obtain an image, measuring a projected shear angle in the obtained image, and determining the actual shear angle between the interior wall and the facesheet using the tilt angle and the projected shear angle.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES LAYERED PRODUCTS LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT ORNON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PERFORMING OPERATIONS PHYSICS TESTING TRANSPORTING |
title | Methods and system for determining shear angle |
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