Automatic center frequency and span setting in a test and measurement instrument

Automatic center frequency and span setting in a test and measurement instrument

A test and measurement instrument having initial display center frequency and span settings and configured to process an input signal is disclosed. The test and measurement instrument includes a processor configured to digitize the input signal and locate a primary peak and determine a primary peak...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Suryan David L, Dees Ian S, Kuntz Thomas L
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Suryan David L
Dees Ian S
Kuntz Thomas L
description A test and measurement instrument having initial display center frequency and span settings and configured to process an input signal is disclosed. The test and measurement instrument includes a processor configured to digitize the input signal and locate a primary peak and determine a primary peak center frequency of the input signal. The processor is configured to adjust the initial display center frequency setting based on the primary peak center frequency. The processor is configured to perform a bandwidth comparison by comparing a bandwidth of the primary peak at a peak bandwidth test level to a peak bandwidth threshold. The processor is configured adjust the initial span setting based on the bandwidth comparison and generate a processed waveform signal using the adjusted display center frequency and span settings.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US9858240B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US9858240B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US9858240B23</originalsourceid><addsrcrecordid>eNrjZAhwLC3Jz00syUxWSE7NK0ktUkgrSi0sTc1LrlRIzEtRKC5IzFMoTi0pycxLV8jMU0hUKEktLgFL5aYmFpcWpeYCtQFlikuKSkFMHgbWtMSc4lReKM3NoODmGuLsoZtakB-fCjQOaE1qSXxosKWFqYWRiYGTkTERSgBSFTd4</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Automatic center frequency and span setting in a test and measurement instrument</title><source>esp@cenet</source><creator>Suryan David L ; Dees Ian S ; Kuntz Thomas L</creator><creatorcontrib>Suryan David L ; Dees Ian S ; Kuntz Thomas L</creatorcontrib><description>A test and measurement instrument having initial display center frequency and span settings and configured to process an input signal is disclosed. The test and measurement instrument includes a processor configured to digitize the input signal and locate a primary peak and determine a primary peak center frequency of the input signal. The processor is configured to adjust the initial display center frequency setting based on the primary peak center frequency. The processor is configured to perform a bandwidth comparison by comparing a bandwidth of the primary peak at a peak bandwidth test level to a peak bandwidth threshold. The processor is configured adjust the initial span setting based on the bandwidth comparison and generate a processed waveform signal using the adjusted display center frequency and span settings.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180102&amp;DB=EPODOC&amp;CC=US&amp;NR=9858240B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180102&amp;DB=EPODOC&amp;CC=US&amp;NR=9858240B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Suryan David L</creatorcontrib><creatorcontrib>Dees Ian S</creatorcontrib><creatorcontrib>Kuntz Thomas L</creatorcontrib><title>Automatic center frequency and span setting in a test and measurement instrument</title><description>A test and measurement instrument having initial display center frequency and span settings and configured to process an input signal is disclosed. The test and measurement instrument includes a processor configured to digitize the input signal and locate a primary peak and determine a primary peak center frequency of the input signal. The processor is configured to adjust the initial display center frequency setting based on the primary peak center frequency. The processor is configured to perform a bandwidth comparison by comparing a bandwidth of the primary peak at a peak bandwidth test level to a peak bandwidth threshold. The processor is configured adjust the initial span setting based on the bandwidth comparison and generate a processed waveform signal using the adjusted display center frequency and span settings.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZAhwLC3Jz00syUxWSE7NK0ktUkgrSi0sTc1LrlRIzEtRKC5IzFMoTi0pycxLV8jMU0hUKEktLgFL5aYmFpcWpeYCtQFlikuKSkFMHgbWtMSc4lReKM3NoODmGuLsoZtakB-fCjQOaE1qSXxosKWFqYWRiYGTkTERSgBSFTd4</recordid><startdate>20180102</startdate><enddate>20180102</enddate><creator>Suryan David L</creator><creator>Dees Ian S</creator><creator>Kuntz Thomas L</creator><scope>EVB</scope></search><sort><creationdate>20180102</creationdate><title>Automatic center frequency and span setting in a test and measurement instrument</title><author>Suryan David L ; Dees Ian S ; Kuntz Thomas L</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US9858240B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2018</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Suryan David L</creatorcontrib><creatorcontrib>Dees Ian S</creatorcontrib><creatorcontrib>Kuntz Thomas L</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Suryan David L</au><au>Dees Ian S</au><au>Kuntz Thomas L</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Automatic center frequency and span setting in a test and measurement instrument</title><date>2018-01-02</date><risdate>2018</risdate><abstract>A test and measurement instrument having initial display center frequency and span settings and configured to process an input signal is disclosed. The test and measurement instrument includes a processor configured to digitize the input signal and locate a primary peak and determine a primary peak center frequency of the input signal. The processor is configured to adjust the initial display center frequency setting based on the primary peak center frequency. The processor is configured to perform a bandwidth comparison by comparing a bandwidth of the primary peak at a peak bandwidth test level to a peak bandwidth threshold. The processor is configured adjust the initial span setting based on the bandwidth comparison and generate a processed waveform signal using the adjusted display center frequency and span settings.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US9858240B2
source esp@cenet
subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Automatic center frequency and span setting in a test and measurement instrument
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-05T17%3A07%3A52IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Suryan%20David%20L&rft.date=2018-01-02&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS9858240B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true