Method and system managing execution of preventative maintenance operation in semiconductor manufacturing equipment
Provided are a method and a system for managing semiconductor manufacturing equipment. The method may be performed using an equipment computer and may include ordering to perform a preventive maintenance to a chamber and parts in the chamber, monitoring a result of the preventive maintenance to the...
Gespeichert in:
Hauptverfasser: | , , , , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | Kang Byungbok Cho Junghyun Han Kyounghoon Lee Jae-Hyun Kim Tae-Hwa Kang Namjun |
description | Provided are a method and a system for managing semiconductor manufacturing equipment. The method may be performed using an equipment computer and may include ordering to perform a preventive maintenance to a chamber and parts in the chamber, monitoring a result of the preventive maintenance to the chamber and the parts, and performing a manufacturing process using plasma reaction in the chamber, if the result of the preventive maintenance is normal. The monitoring the result of the preventive maintenance may include a pre-screening method monitoring the result of the preventive maintenance using electric reflection coefficients obtained from the chamber and the parts without using the plasma reaction. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US9721762B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US9721762B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US9721762B23</originalsourceid><addsrcrecordid>eNqNzDEKwkAQRuE0FqLeYS5gYQSDraLYWKl1GDZ_4oI7u-7OBr29MXgAq9d8vGmRztC7b4ilofROCkeOhTsrHeEFk9V6Id9SiOghymp7DMSKQlgMyAdEHpUVSnDWeGmyUR-_p9yy0RzH3TPb4IbHvJi0_EhY_Dor6Hi47k9LBF8jBTYQaH27bKtyVW3KXbn-g3wAgTdF5w</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method and system managing execution of preventative maintenance operation in semiconductor manufacturing equipment</title><source>esp@cenet</source><creator>Kang Byungbok ; Cho Junghyun ; Han Kyounghoon ; Lee Jae-Hyun ; Kim Tae-Hwa ; Kang Namjun</creator><creatorcontrib>Kang Byungbok ; Cho Junghyun ; Han Kyounghoon ; Lee Jae-Hyun ; Kim Tae-Hwa ; Kang Namjun</creatorcontrib><description>Provided are a method and a system for managing semiconductor manufacturing equipment. The method may be performed using an equipment computer and may include ordering to perform a preventive maintenance to a chamber and parts in the chamber, monitoring a result of the preventive maintenance to the chamber and the parts, and performing a manufacturing process using plasma reaction in the chamber, if the result of the preventive maintenance is normal. The monitoring the result of the preventive maintenance may include a pre-screening method monitoring the result of the preventive maintenance using electric reflection coefficients obtained from the chamber and the parts without using the plasma reaction.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; CALCULATING ; COMPUTING ; CONTROL OR REGULATING SYSTEMS IN GENERAL ; CONTROLLING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY ; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS ; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS ; PHYSICS ; REGULATING</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170801&DB=EPODOC&CC=US&NR=9721762B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170801&DB=EPODOC&CC=US&NR=9721762B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Kang Byungbok</creatorcontrib><creatorcontrib>Cho Junghyun</creatorcontrib><creatorcontrib>Han Kyounghoon</creatorcontrib><creatorcontrib>Lee Jae-Hyun</creatorcontrib><creatorcontrib>Kim Tae-Hwa</creatorcontrib><creatorcontrib>Kang Namjun</creatorcontrib><title>Method and system managing execution of preventative maintenance operation in semiconductor manufacturing equipment</title><description>Provided are a method and a system for managing semiconductor manufacturing equipment. The method may be performed using an equipment computer and may include ordering to perform a preventive maintenance to a chamber and parts in the chamber, monitoring a result of the preventive maintenance to the chamber and the parts, and performing a manufacturing process using plasma reaction in the chamber, if the result of the preventive maintenance is normal. The monitoring the result of the preventive maintenance may include a pre-screening method monitoring the result of the preventive maintenance using electric reflection coefficients obtained from the chamber and the parts without using the plasma reaction.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL</subject><subject>CONTROLLING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><subject>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</subject><subject>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</subject><subject>PHYSICS</subject><subject>REGULATING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNzDEKwkAQRuE0FqLeYS5gYQSDraLYWKl1GDZ_4oI7u-7OBr29MXgAq9d8vGmRztC7b4ilofROCkeOhTsrHeEFk9V6Id9SiOghymp7DMSKQlgMyAdEHpUVSnDWeGmyUR-_p9yy0RzH3TPb4IbHvJi0_EhY_Dor6Hi47k9LBF8jBTYQaH27bKtyVW3KXbn-g3wAgTdF5w</recordid><startdate>20170801</startdate><enddate>20170801</enddate><creator>Kang Byungbok</creator><creator>Cho Junghyun</creator><creator>Han Kyounghoon</creator><creator>Lee Jae-Hyun</creator><creator>Kim Tae-Hwa</creator><creator>Kang Namjun</creator><scope>EVB</scope></search><sort><creationdate>20170801</creationdate><title>Method and system managing execution of preventative maintenance operation in semiconductor manufacturing equipment</title><author>Kang Byungbok ; Cho Junghyun ; Han Kyounghoon ; Lee Jae-Hyun ; Kim Tae-Hwa ; Kang Namjun</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US9721762B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2017</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>CONTROL OR REGULATING SYSTEMS IN GENERAL</topic><topic>CONTROLLING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><topic>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</topic><topic>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</topic><topic>PHYSICS</topic><topic>REGULATING</topic><toplevel>online_resources</toplevel><creatorcontrib>Kang Byungbok</creatorcontrib><creatorcontrib>Cho Junghyun</creatorcontrib><creatorcontrib>Han Kyounghoon</creatorcontrib><creatorcontrib>Lee Jae-Hyun</creatorcontrib><creatorcontrib>Kim Tae-Hwa</creatorcontrib><creatorcontrib>Kang Namjun</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kang Byungbok</au><au>Cho Junghyun</au><au>Han Kyounghoon</au><au>Lee Jae-Hyun</au><au>Kim Tae-Hwa</au><au>Kang Namjun</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method and system managing execution of preventative maintenance operation in semiconductor manufacturing equipment</title><date>2017-08-01</date><risdate>2017</risdate><abstract>Provided are a method and a system for managing semiconductor manufacturing equipment. The method may be performed using an equipment computer and may include ordering to perform a preventive maintenance to a chamber and parts in the chamber, monitoring a result of the preventive maintenance to the chamber and the parts, and performing a manufacturing process using plasma reaction in the chamber, if the result of the preventive maintenance is normal. The monitoring the result of the preventive maintenance may include a pre-screening method monitoring the result of the preventive maintenance using electric reflection coefficients obtained from the chamber and the parts without using the plasma reaction.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_US9721762B2 |
source | esp@cenet |
subjects | BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING |
title | Method and system managing execution of preventative maintenance operation in semiconductor manufacturing equipment |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T07%3A56%3A22IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Kang%20Byungbok&rft.date=2017-08-01&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS9721762B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |