System, method and fixture for performing both optical power and wavelength measurements of light emitted from a laser diode

A dual testing system and method is used to perform both optical power and wavelength measurements on laser light emitted from a laser diode, such as a chip-on-submount (COS) laser diode or a laser diode in a bar laser. A testing fixture may be used to facilitate both measurements by simultaneously...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Luo Guipeng, Chang Hung-Lun, Anselm Klaus Alexander
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS COLORIMETRY DEVICES USING STIMULATED EMISSION ELECTRICITY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING
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