Atomic layer deposition of P-type oxide semiconductor thin films

Provided herein are methods of depositing p-type metal oxide thin films by atomic layer deposition (ALD). Also provided are p-type metal oxide thin films and TFTs including p-type metal oxide channels. In some implementations, the p-type metal oxide thin films have a metal and oxygen vacancy defect...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Hong John Hyunchul, Nomura Kenji
Format: Patent
Sprache:eng
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