Methods including a processing of wafers and spin coating tool

A method includes performing a spin coating process. In the spin coating process, a first fluid is dispensed to a surface of a wafer. The method further includes performing an inspection of an edge area of the wafer. On the basis of the inspection of the edge area of the wafer, a defect analysis is...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Hotzel Arthur, Maehr Torsten, Freitag Martin
Format: Patent
Sprache:eng
Schlagworte:
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