Emission source microscopy for electromagnetic interference applications

A system and method for performing radiation source analysis on a device under test (DUT) uses discrete Fourier transform on measured field components values at different sampling locations away from the DUT to derive field component values at locations on the DUT. The results of the discrete Fourie...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	Kajbaf Hamed
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING ELECTRIC VARIABLES MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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