Methods and apparatus to detect a conductive object

Methods and apparatus to detect a conductive object

A method and apparatus scan a first capacitive sensor element that is located in a first scan region for a presence of a conductive object and then scan a second capacitive sensor element that is located in a second scan region for the presence of the conductive object. The scan of the first capacit...

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1. Verfasser: Hoshtanar Oleksandr
Format: Patent
Sprache:eng
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APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SCANNING-PROBE TECHNIQUES OR APPARATUS
TESTING
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creator Hoshtanar Oleksandr
description A method and apparatus scan a first capacitive sensor element that is located in a first scan region for a presence of a conductive object and then scan a second capacitive sensor element that is located in a second scan region for the presence of the conductive object. The scan of the first capacitive sensor element includes applying a ground voltage to a ground element through the second capacitive sensor element, the ground element located in the first scan region.
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subjects APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SCANNING-PROBE TECHNIQUES OR APPARATUS
TESTING
title Methods and apparatus to detect a conductive object
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