Integrated parameter monitoring in a fiber laser/amplifier

Techniques are disclosed for monitoring parameters in a high power fiber laser or amplifier system without adding a tap coupler or increasing fiber length. In some embodiments, a cladding stripper is used to draw off a small percentage of light propagating in the cladding to an integrated signal par...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Creeden Daniel J, Owen Joseph M
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Creeden Daniel J
Owen Joseph M
description Techniques are disclosed for monitoring parameters in a high power fiber laser or amplifier system without adding a tap coupler or increasing fiber length. In some embodiments, a cladding stripper is used to draw off a small percentage of light propagating in the cladding to an integrated signal parameter monitor. Parameters at one or more specific wavelengths (e.g., pump signal wavelength, signal/core signal wavelength, etc) can be monitored. In some such cases, filters can be used to allow for selective passing of signal wavelength to be monitored to a corresponding parameter monitor. The filters can be external or may be integrated into a parameter monitor package that includes cladding stripper with integrated parameter monitor. Other parameters of interest (e.g., phase, wavelength) can also be monitored, in addition to, or as an alternative to power. Numerous configurations and variations will be apparent in light of this disclosure (e.g., system-on-chip).
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US9534952B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US9534952B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US9534952B23</originalsourceid><addsrcrecordid>eNrjZLDyzCtJTS9KLElNUShILErMTS1JLVLIzc_LLMkvysxLV8jMU0hUSMtMAormJBanFukn5hbkZKZlphbxMLCmJeYUp_JCaW4GBTfXEGcP3dSC_PjU4oLE5NS81JL40GBLU2MTS1MjJyNjIpQAADkgLwo</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Integrated parameter monitoring in a fiber laser/amplifier</title><source>esp@cenet</source><creator>Creeden Daniel J ; Owen Joseph M</creator><creatorcontrib>Creeden Daniel J ; Owen Joseph M</creatorcontrib><description>Techniques are disclosed for monitoring parameters in a high power fiber laser or amplifier system without adding a tap coupler or increasing fiber length. In some embodiments, a cladding stripper is used to draw off a small percentage of light propagating in the cladding to an integrated signal parameter monitor. Parameters at one or more specific wavelengths (e.g., pump signal wavelength, signal/core signal wavelength, etc) can be monitored. In some such cases, filters can be used to allow for selective passing of signal wavelength to be monitored to a corresponding parameter monitor. The filters can be external or may be integrated into a parameter monitor package that includes cladding stripper with integrated parameter monitor. Other parameters of interest (e.g., phase, wavelength) can also be monitored, in addition to, or as an alternative to power. Numerous configurations and variations will be apparent in light of this disclosure (e.g., system-on-chip).</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; COLORIMETRY ; DEVICES USING STIMULATED EMISSION ; ELECTRICITY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20170103&amp;DB=EPODOC&amp;CC=US&amp;NR=9534952B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20170103&amp;DB=EPODOC&amp;CC=US&amp;NR=9534952B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Creeden Daniel J</creatorcontrib><creatorcontrib>Owen Joseph M</creatorcontrib><title>Integrated parameter monitoring in a fiber laser/amplifier</title><description>Techniques are disclosed for monitoring parameters in a high power fiber laser or amplifier system without adding a tap coupler or increasing fiber length. In some embodiments, a cladding stripper is used to draw off a small percentage of light propagating in the cladding to an integrated signal parameter monitor. Parameters at one or more specific wavelengths (e.g., pump signal wavelength, signal/core signal wavelength, etc) can be monitored. In some such cases, filters can be used to allow for selective passing of signal wavelength to be monitored to a corresponding parameter monitor. The filters can be external or may be integrated into a parameter monitor package that includes cladding stripper with integrated parameter monitor. Other parameters of interest (e.g., phase, wavelength) can also be monitored, in addition to, or as an alternative to power. Numerous configurations and variations will be apparent in light of this disclosure (e.g., system-on-chip).</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>COLORIMETRY</subject><subject>DEVICES USING STIMULATED EMISSION</subject><subject>ELECTRICITY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLDyzCtJTS9KLElNUShILErMTS1JLVLIzc_LLMkvysxLV8jMU0hUSMtMAormJBanFukn5hbkZKZlphbxMLCmJeYUp_JCaW4GBTfXEGcP3dSC_PjU4oLE5NS81JL40GBLU2MTS1MjJyNjIpQAADkgLwo</recordid><startdate>20170103</startdate><enddate>20170103</enddate><creator>Creeden Daniel J</creator><creator>Owen Joseph M</creator><scope>EVB</scope></search><sort><creationdate>20170103</creationdate><title>Integrated parameter monitoring in a fiber laser/amplifier</title><author>Creeden Daniel J ; Owen Joseph M</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US9534952B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2017</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>COLORIMETRY</topic><topic>DEVICES USING STIMULATED EMISSION</topic><topic>ELECTRICITY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Creeden Daniel J</creatorcontrib><creatorcontrib>Owen Joseph M</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Creeden Daniel J</au><au>Owen Joseph M</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Integrated parameter monitoring in a fiber laser/amplifier</title><date>2017-01-03</date><risdate>2017</risdate><abstract>Techniques are disclosed for monitoring parameters in a high power fiber laser or amplifier system without adding a tap coupler or increasing fiber length. In some embodiments, a cladding stripper is used to draw off a small percentage of light propagating in the cladding to an integrated signal parameter monitor. Parameters at one or more specific wavelengths (e.g., pump signal wavelength, signal/core signal wavelength, etc) can be monitored. In some such cases, filters can be used to allow for selective passing of signal wavelength to be monitored to a corresponding parameter monitor. The filters can be external or may be integrated into a parameter monitor package that includes cladding stripper with integrated parameter monitor. Other parameters of interest (e.g., phase, wavelength) can also be monitored, in addition to, or as an alternative to power. Numerous configurations and variations will be apparent in light of this disclosure (e.g., system-on-chip).</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US9534952B2
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
COLORIMETRY
DEVICES USING STIMULATED EMISSION
ELECTRICITY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
RADIATION PYROMETRY
TESTING
title Integrated parameter monitoring in a fiber laser/amplifier
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-26T11%3A44%3A04IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Creeden%20Daniel%20J&rft.date=2017-01-03&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS9534952B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true