Measurement tool for server rack
A structure for measuring server rack dimensions. The structure may include; a center spacer having a slider opening; a top panel fixed to a top surface of the center spacer; a bottom panel fixed to a bottom surface of the center spacer; and a slider in the slider opening of the center spacer, where...
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| creator | Spangler, Jr. Don S Daley Michael E Wesely Ronald S |
| description | A structure for measuring server rack dimensions. The structure may include; a center spacer having a slider opening; a top panel fixed to a top surface of the center spacer; a bottom panel fixed to a bottom surface of the center spacer; and a slider in the slider opening of the center spacer, wherein a portion of the slider is between the top panel and the bottom panel, and the slider is horizontally movable between a starting position and an extended position, the starting position is where the slider is closest to the center of the center spacer and the extended position is where the slider is farthest from the center of the center spacer. |
| format | Patent |
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The structure may include; a center spacer having a slider opening; a top panel fixed to a top surface of the center spacer; a bottom panel fixed to a bottom surface of the center spacer; and a slider in the slider opening of the center spacer, wherein a portion of the slider is between the top panel and the bottom panel, and the slider is horizontally movable between a starting position and an extended position, the starting position is where the slider is closest to the center of the center spacer and the extended position is where the slider is farthest from the center of the center spacer.</description><language>eng</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20161115&DB=EPODOC&CC=US&NR=9494406B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20161115&DB=EPODOC&CC=US&NR=9494406B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Spangler, Jr. Don S</creatorcontrib><creatorcontrib>Daley Michael E</creatorcontrib><creatorcontrib>Wesely Ronald S</creatorcontrib><title>Measurement tool for server rack</title><description>A structure for measuring server rack dimensions. The structure may include; a center spacer having a slider opening; a top panel fixed to a top surface of the center spacer; a bottom panel fixed to a bottom surface of the center spacer; and a slider in the slider opening of the center spacer, wherein a portion of the slider is between the top panel and the bottom panel, and the slider is horizontally movable between a starting position and an extended position, the starting position is where the slider is closest to the center of the center spacer and the extended position is where the slider is farthest from the center of the center spacer.</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFDwTU0sLi1KzU3NK1Eoyc_PUUjLL1IoTi0qSy1SKEpMzuZhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfGhwZYmliYmBmZOhsZEKAEAGpElIg</recordid><startdate>20161115</startdate><enddate>20161115</enddate><creator>Spangler, Jr. Don S</creator><creator>Daley Michael E</creator><creator>Wesely Ronald S</creator><scope>EVB</scope></search><sort><creationdate>20161115</creationdate><title>Measurement tool for server rack</title><author>Spangler, Jr. Don S ; Daley Michael E ; Wesely Ronald S</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US9494406B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2016</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Spangler, Jr. Don S</creatorcontrib><creatorcontrib>Daley Michael E</creatorcontrib><creatorcontrib>Wesely Ronald S</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Spangler, Jr. Don S</au><au>Daley Michael E</au><au>Wesely Ronald S</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Measurement tool for server rack</title><date>2016-11-15</date><risdate>2016</risdate><abstract>A structure for measuring server rack dimensions. The structure may include; a center spacer having a slider opening; a top panel fixed to a top surface of the center spacer; a bottom panel fixed to a bottom surface of the center spacer; and a slider in the slider opening of the center spacer, wherein a portion of the slider is between the top panel and the bottom panel, and the slider is horizontally movable between a starting position and an extended position, the starting position is where the slider is closest to the center of the center spacer and the extended position is where the slider is farthest from the center of the center spacer.</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng |
| recordid | cdi_epo_espacenet_US9494406B1 |
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| subjects | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | Measurement tool for server rack |
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