Auto-blow memory repair

In an example embodiment, a method may include collecting, at a controller within an integrated circuit, defect information indicative of defects identified during a built-in self-test (BIST) operation performed on plural memories embedded within the integrated circuit. Fuses within the integrated c...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Carlson David A, Aiken Steven W
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE PHYSICS STATIC STORES
Online-Zugang:	Volltext bestellen
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