Varying power load conditions on systems under test
An apparatus includes a system test module that initiates a system power test for a computer system. The computer system includes one or more power supplies that provide power to system components. The system power test includes determining power system characteristics under various loading conditio...
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| creator | Gorey Anthony G Hirst Jason T Coq Marc H Jones Rohan A Joseph Michel H Stanquist Gerald G Stocker Brian W |
| description | An apparatus includes a system test module that initiates a system power test for a computer system. The computer system includes one or more power supplies that provide power to system components. The system power test includes determining power system characteristics under various loading conditions. The apparatus includes a configure module that configures a system component during the system power test. The system component uses a higher amount of power after being configured than in a previous un-configured condition. The apparatus includes a de-configure module that de-configures the system component during the system power test. The system component uses a lower amount of power after being de-configured than in a previous configured condition. The apparatus includes a diagnostic module that measures power system performance of the computer system during varying loading conditions caused by configuring and de-configuring one or more system components by the configure module and the de-configure module. |
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The computer system includes one or more power supplies that provide power to system components. The system power test includes determining power system characteristics under various loading conditions. The apparatus includes a configure module that configures a system component during the system power test. The system component uses a higher amount of power after being configured than in a previous un-configured condition. The apparatus includes a de-configure module that de-configures the system component during the system power test. The system component uses a lower amount of power after being de-configured than in a previous configured condition. 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The apparatus includes a diagnostic module that measures power system performance of the computer system during varying loading conditions caused by configuring and de-configuring one or more system components by the configure module and the de-configure module.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDAOSyyqzMxLVyjIL08tUsjJT0xRSM7PS8ksyczPK1bIz1MoriwuSc0tVijNSwEqKEktLuFhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfGhwZYm5uZG5uZORsZEKAEA0CIsnA</recordid><startdate>20161025</startdate><enddate>20161025</enddate><creator>Gorey Anthony G</creator><creator>Hirst Jason T</creator><creator>Coq Marc H</creator><creator>Jones Rohan A</creator><creator>Joseph Michel H</creator><creator>Stanquist Gerald G</creator><creator>Stocker Brian W</creator><scope>EVB</scope></search><sort><creationdate>20161025</creationdate><title>Varying power load conditions on systems under test</title><author>Gorey Anthony G ; Hirst Jason T ; Coq Marc H ; Jones Rohan A ; Joseph Michel H ; Stanquist Gerald G ; Stocker Brian W</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US9477277B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2016</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Gorey Anthony G</creatorcontrib><creatorcontrib>Hirst Jason T</creatorcontrib><creatorcontrib>Coq Marc H</creatorcontrib><creatorcontrib>Jones Rohan A</creatorcontrib><creatorcontrib>Joseph Michel H</creatorcontrib><creatorcontrib>Stanquist Gerald G</creatorcontrib><creatorcontrib>Stocker Brian W</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Gorey Anthony G</au><au>Hirst Jason T</au><au>Coq Marc H</au><au>Jones Rohan A</au><au>Joseph Michel H</au><au>Stanquist Gerald G</au><au>Stocker Brian W</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Varying power load conditions on systems under test</title><date>2016-10-25</date><risdate>2016</risdate><abstract>An apparatus includes a system test module that initiates a system power test for a computer system. The computer system includes one or more power supplies that provide power to system components. The system power test includes determining power system characteristics under various loading conditions. The apparatus includes a configure module that configures a system component during the system power test. The system component uses a higher amount of power after being configured than in a previous un-configured condition. The apparatus includes a de-configure module that de-configures the system component during the system power test. The system component uses a lower amount of power after being de-configured than in a previous configured condition. The apparatus includes a diagnostic module that measures power system performance of the computer system during varying loading conditions caused by configuring and de-configuring one or more system components by the configure module and the de-configure module.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Varying power load conditions on systems under test |
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