Encoder alignment structure
An encoder system comprising an encoder assembly and an encoder alignment structure is disclosed. The encoder assembly may include at least a coding member, a hub, and a housing. The encoder alignment structure may comprise a major surface, a plurality of catches, and a recessed region. The major su...
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creator | Lim Chong Hon Kuan Andrew Tuck Loon Tan Siow Ming Yap Kek Leong |
description | An encoder system comprising an encoder assembly and an encoder alignment structure is disclosed. The encoder assembly may include at least a coding member, a hub, and a housing. The encoder alignment structure may comprise a major surface, a plurality of catches, and a recessed region. The major surface may be coupled with the housing to substantially enclose the hub and the coding member. The plurality of catches may be disposed around the periphery of the major surface and may be configured to secure the encoder alignment structure to the housing. The recessed region of the major surface may be converging from the periphery of the major surface between two of the plurality of catches towards the hub so as to provide access for a user to adjust the hub around the axis of rotation. |
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The encoder assembly may include at least a coding member, a hub, and a housing. The encoder alignment structure may comprise a major surface, a plurality of catches, and a recessed region. The major surface may be coupled with the housing to substantially enclose the hub and the coding member. The plurality of catches may be disposed around the periphery of the major surface and may be configured to secure the encoder alignment structure to the housing. The recessed region of the major surface may be converging from the periphery of the major surface between two of the plurality of catches towards the hub so as to provide access for a user to adjust the hub around the axis of rotation.</description><language>eng</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; MEASURING ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20161018&DB=EPODOC&CC=US&NR=9470558B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20161018&DB=EPODOC&CC=US&NR=9470558B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Lim Chong Hon</creatorcontrib><creatorcontrib>Kuan Andrew Tuck Loon</creatorcontrib><creatorcontrib>Tan Siow Ming</creatorcontrib><creatorcontrib>Yap Kek Leong</creatorcontrib><title>Encoder alignment structure</title><description>An encoder system comprising an encoder assembly and an encoder alignment structure is disclosed. The encoder assembly may include at least a coding member, a hub, and a housing. The encoder alignment structure may comprise a major surface, a plurality of catches, and a recessed region. The major surface may be coupled with the housing to substantially enclose the hub and the coding member. The plurality of catches may be disposed around the periphery of the major surface and may be configured to secure the encoder alignment structure to the housing. The recessed region of the major surface may be converging from the periphery of the major surface between two of the plurality of catches towards the hub so as to provide access for a user to adjust the hub around the axis of rotation.</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>MEASURING</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJB2zUvOT0ktUkjMyUzPy03NK1EoLikqTS4pLUrlYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxocGWJuYGpqYWTkbGRCgBAFVII5A</recordid><startdate>20161018</startdate><enddate>20161018</enddate><creator>Lim Chong Hon</creator><creator>Kuan Andrew Tuck Loon</creator><creator>Tan Siow Ming</creator><creator>Yap Kek Leong</creator><scope>EVB</scope></search><sort><creationdate>20161018</creationdate><title>Encoder alignment structure</title><author>Lim Chong Hon ; Kuan Andrew Tuck Loon ; Tan Siow Ming ; Yap Kek Leong</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US9470558B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2016</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>MEASURING</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Lim Chong Hon</creatorcontrib><creatorcontrib>Kuan Andrew Tuck Loon</creatorcontrib><creatorcontrib>Tan Siow Ming</creatorcontrib><creatorcontrib>Yap Kek Leong</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Lim Chong Hon</au><au>Kuan Andrew Tuck Loon</au><au>Tan Siow Ming</au><au>Yap Kek Leong</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Encoder alignment structure</title><date>2016-10-18</date><risdate>2016</risdate><abstract>An encoder system comprising an encoder assembly and an encoder alignment structure is disclosed. The encoder assembly may include at least a coding member, a hub, and a housing. The encoder alignment structure may comprise a major surface, a plurality of catches, and a recessed region. The major surface may be coupled with the housing to substantially enclose the hub and the coding member. The plurality of catches may be disposed around the periphery of the major surface and may be configured to secure the encoder alignment structure to the housing. The recessed region of the major surface may be converging from the periphery of the major surface between two of the plurality of catches towards the hub so as to provide access for a user to adjust the hub around the axis of rotation.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING |
title | Encoder alignment structure |
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