Delta-sigma analog-to-digital converter (ADC) with time-interleaved (TI) or two-step successive approximation register (SAR) quantizer
Certain aspects of the present disclosure provide a delta-sigma modulator (DSM) using time-interleaved (TI) successive approximation register (SAR) analog-to-digital converters (ADCs). For example, two SAR ADCs may be configured to alternately sample and process an input signal and provide a feedbac...
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creator | Kiran Ganesh Han Changsok Dai Liang Mirhaj Seyed Arash Rajaee Omid |
description | Certain aspects of the present disclosure provide a delta-sigma modulator (DSM) using time-interleaved (TI) successive approximation register (SAR) analog-to-digital converters (ADCs). For example, two SAR ADCs may be configured to alternately sample and process an input signal and provide a feedback signal for the DSM using excess loop delay (ELD). In other aspects, the DSM may be implemented using a two-step SAR quantizer. For example, a first SAR ADC may sample an input signal to generate a most-significant bit (MSB) portion of an output of the DSM, while the second SAR ADC may subsequently sample a residue from the first SAR ADC conversion and generate a least-significant bit (LSB) portion of the output of the DSM. With these techniques, higher bandwidths may be obtained in high accuracy delta-sigma ADCs without using increased sampling rates. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US9455737B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US9455737B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US9455737B13</originalsourceid><addsrcrecordid>eNqNjEsKwjAQQLtxIeodZmkXWYiKuNRW0a2ftQzpGAfSJCbTVjyA51bEA7h68Hi8fvYqyQqqxKZGQIfWGyVeVWxY0IL2rqUoFGG8KoscOpYbCNek2H2sJWypgvFpn4OPIJ1XSShAarSmlLglwBCif3CNwt5BJMPpuzuuDjncG3TCT4rDrHdFm2j04yCD7eZU7BQFf6EUUJMjuZyPy9l8vpgu1pPpH8kbwbpKFw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Delta-sigma analog-to-digital converter (ADC) with time-interleaved (TI) or two-step successive approximation register (SAR) quantizer</title><source>esp@cenet</source><creator>Kiran Ganesh ; Han Changsok ; Dai Liang ; Mirhaj Seyed Arash ; Rajaee Omid</creator><creatorcontrib>Kiran Ganesh ; Han Changsok ; Dai Liang ; Mirhaj Seyed Arash ; Rajaee Omid</creatorcontrib><description>Certain aspects of the present disclosure provide a delta-sigma modulator (DSM) using time-interleaved (TI) successive approximation register (SAR) analog-to-digital converters (ADCs). For example, two SAR ADCs may be configured to alternately sample and process an input signal and provide a feedback signal for the DSM using excess loop delay (ELD). In other aspects, the DSM may be implemented using a two-step SAR quantizer. For example, a first SAR ADC may sample an input signal to generate a most-significant bit (MSB) portion of an output of the DSM, while the second SAR ADC may subsequently sample a residue from the first SAR ADC conversion and generate a least-significant bit (LSB) portion of the output of the DSM. With these techniques, higher bandwidths may be obtained in high accuracy delta-sigma ADCs without using increased sampling rates.</description><language>eng</language><subject>BASIC ELECTRONIC CIRCUITRY ; CODE CONVERSION IN GENERAL ; CODING ; DECODING ; ELECTRICITY</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160927&DB=EPODOC&CC=US&NR=9455737B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160927&DB=EPODOC&CC=US&NR=9455737B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Kiran Ganesh</creatorcontrib><creatorcontrib>Han Changsok</creatorcontrib><creatorcontrib>Dai Liang</creatorcontrib><creatorcontrib>Mirhaj Seyed Arash</creatorcontrib><creatorcontrib>Rajaee Omid</creatorcontrib><title>Delta-sigma analog-to-digital converter (ADC) with time-interleaved (TI) or two-step successive approximation register (SAR) quantizer</title><description>Certain aspects of the present disclosure provide a delta-sigma modulator (DSM) using time-interleaved (TI) successive approximation register (SAR) analog-to-digital converters (ADCs). For example, two SAR ADCs may be configured to alternately sample and process an input signal and provide a feedback signal for the DSM using excess loop delay (ELD). In other aspects, the DSM may be implemented using a two-step SAR quantizer. For example, a first SAR ADC may sample an input signal to generate a most-significant bit (MSB) portion of an output of the DSM, while the second SAR ADC may subsequently sample a residue from the first SAR ADC conversion and generate a least-significant bit (LSB) portion of the output of the DSM. With these techniques, higher bandwidths may be obtained in high accuracy delta-sigma ADCs without using increased sampling rates.</description><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>CODE CONVERSION IN GENERAL</subject><subject>CODING</subject><subject>DECODING</subject><subject>ELECTRICITY</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjEsKwjAQQLtxIeodZmkXWYiKuNRW0a2ftQzpGAfSJCbTVjyA51bEA7h68Hi8fvYqyQqqxKZGQIfWGyVeVWxY0IL2rqUoFGG8KoscOpYbCNek2H2sJWypgvFpn4OPIJ1XSShAarSmlLglwBCif3CNwt5BJMPpuzuuDjncG3TCT4rDrHdFm2j04yCD7eZU7BQFf6EUUJMjuZyPy9l8vpgu1pPpH8kbwbpKFw</recordid><startdate>20160927</startdate><enddate>20160927</enddate><creator>Kiran Ganesh</creator><creator>Han Changsok</creator><creator>Dai Liang</creator><creator>Mirhaj Seyed Arash</creator><creator>Rajaee Omid</creator><scope>EVB</scope></search><sort><creationdate>20160927</creationdate><title>Delta-sigma analog-to-digital converter (ADC) with time-interleaved (TI) or two-step successive approximation register (SAR) quantizer</title><author>Kiran Ganesh ; Han Changsok ; Dai Liang ; Mirhaj Seyed Arash ; Rajaee Omid</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US9455737B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2016</creationdate><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>CODE CONVERSION IN GENERAL</topic><topic>CODING</topic><topic>DECODING</topic><topic>ELECTRICITY</topic><toplevel>online_resources</toplevel><creatorcontrib>Kiran Ganesh</creatorcontrib><creatorcontrib>Han Changsok</creatorcontrib><creatorcontrib>Dai Liang</creatorcontrib><creatorcontrib>Mirhaj Seyed Arash</creatorcontrib><creatorcontrib>Rajaee Omid</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kiran Ganesh</au><au>Han Changsok</au><au>Dai Liang</au><au>Mirhaj Seyed Arash</au><au>Rajaee Omid</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Delta-sigma analog-to-digital converter (ADC) with time-interleaved (TI) or two-step successive approximation register (SAR) quantizer</title><date>2016-09-27</date><risdate>2016</risdate><abstract>Certain aspects of the present disclosure provide a delta-sigma modulator (DSM) using time-interleaved (TI) successive approximation register (SAR) analog-to-digital converters (ADCs). For example, two SAR ADCs may be configured to alternately sample and process an input signal and provide a feedback signal for the DSM using excess loop delay (ELD). In other aspects, the DSM may be implemented using a two-step SAR quantizer. For example, a first SAR ADC may sample an input signal to generate a most-significant bit (MSB) portion of an output of the DSM, while the second SAR ADC may subsequently sample a residue from the first SAR ADC conversion and generate a least-significant bit (LSB) portion of the output of the DSM. With these techniques, higher bandwidths may be obtained in high accuracy delta-sigma ADCs without using increased sampling rates.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRONIC CIRCUITRY CODE CONVERSION IN GENERAL CODING DECODING ELECTRICITY |
title | Delta-sigma analog-to-digital converter (ADC) with time-interleaved (TI) or two-step successive approximation register (SAR) quantizer |
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