Determining worst-case bit patterns based upon data-dependent jitter
The patent application discloses mechanisms that, for a given channel step or edge response, bit interval, and data dependent jitter table can directly determine the minimal eye or bit error rate opening by building a worst case pattern considering the effect of data dependent jitter. These mechanis...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | Dmitriev-Zdorov Vladimir |
| description | The patent application discloses mechanisms that, for a given channel step or edge response, bit interval, and data dependent jitter table can directly determine the minimal eye or bit error rate opening by building a worst case pattern considering the effect of data dependent jitter. These mechanisms can be based on building an indexed table of jitter samples, preparing a structure in the form of connected elements corresponding to the jitter samples, and then applying dynamic programming to determine paths through the connected elements. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US9435840B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US9435840B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US9435840B23</originalsourceid><addsrcrecordid>eNrjZHBxSS1JLcrNzMvMS1cozy8qLtFNTixOVUjKLFEoSCwByuUVKyQBRVIUSgvy8xRSEksSdVNSC1LzUlLzShSyMkFKeBhY0xJzilN5oTQ3g4Kba4izh25qQX58anFBYnJqXmpJfGiwpYmxqYWJgZORMRFKAHhPMt4</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Determining worst-case bit patterns based upon data-dependent jitter</title><source>esp@cenet</source><creator>Dmitriev-Zdorov Vladimir</creator><creatorcontrib>Dmitriev-Zdorov Vladimir</creatorcontrib><description>The patent application discloses mechanisms that, for a given channel step or edge response, bit interval, and data dependent jitter table can directly determine the minimal eye or bit error rate opening by building a worst case pattern considering the effect of data dependent jitter. These mechanisms can be based on building an indexed table of jitter samples, preparing a structure in the form of connected elements corresponding to the jitter samples, and then applying dynamic programming to determine paths through the connected elements.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC COMMUNICATION TECHNIQUE ; ELECTRIC DIGITAL DATA PROCESSING ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING ; TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160906&DB=EPODOC&CC=US&NR=9435840B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160906&DB=EPODOC&CC=US&NR=9435840B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Dmitriev-Zdorov Vladimir</creatorcontrib><title>Determining worst-case bit patterns based upon data-dependent jitter</title><description>The patent application discloses mechanisms that, for a given channel step or edge response, bit interval, and data dependent jitter table can directly determine the minimal eye or bit error rate opening by building a worst case pattern considering the effect of data dependent jitter. These mechanisms can be based on building an indexed table of jitter samples, preparing a structure in the form of connected elements corresponding to the jitter samples, and then applying dynamic programming to determine paths through the connected elements.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC COMMUNICATION TECHNIQUE</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHBxSS1JLcrNzMvMS1cozy8qLtFNTixOVUjKLFEoSCwByuUVKyQBRVIUSgvy8xRSEksSdVNSC1LzUlLzShSyMkFKeBhY0xJzilN5oTQ3g4Kba4izh25qQX58anFBYnJqXmpJfGiwpYmxqYWJgZORMRFKAHhPMt4</recordid><startdate>20160906</startdate><enddate>20160906</enddate><creator>Dmitriev-Zdorov Vladimir</creator><scope>EVB</scope></search><sort><creationdate>20160906</creationdate><title>Determining worst-case bit patterns based upon data-dependent jitter</title><author>Dmitriev-Zdorov Vladimir</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US9435840B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2016</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC COMMUNICATION TECHNIQUE</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION</topic><toplevel>online_resources</toplevel><creatorcontrib>Dmitriev-Zdorov Vladimir</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Dmitriev-Zdorov Vladimir</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Determining worst-case bit patterns based upon data-dependent jitter</title><date>2016-09-06</date><risdate>2016</risdate><abstract>The patent application discloses mechanisms that, for a given channel step or edge response, bit interval, and data dependent jitter table can directly determine the minimal eye or bit error rate opening by building a worst case pattern considering the effect of data dependent jitter. These mechanisms can be based on building an indexed table of jitter samples, preparing a structure in the form of connected elements corresponding to the jitter samples, and then applying dynamic programming to determine paths through the connected elements.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US9435840B2 |
| source | esp@cenet |
| subjects | CALCULATING COMPUTING COUNTING ELECTRIC COMMUNICATION TECHNIQUE ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION |
| title | Determining worst-case bit patterns based upon data-dependent jitter |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-13T07%3A50%3A24IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Dmitriev-Zdorov%20Vladimir&rft.date=2016-09-06&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS9435840B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |