Hierarchical, distributed built-in self-repair solution

A built-in self-test (BIST) circuit to test one or more memory blocks on an integrated circuit. The one or more memory blocks further includes a first memory block and a second memory block A built-in soft-repair controller (BISoR) is provided to soft repair the one or more memory blocks. The BIST c...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ELLUR HARSHARAJ, VARADARAJAN DEVANATHAN, KS RAGHAVENDRA PRASAD
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE PHYSICS STATIC STORES
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!