Hierarchical, distributed built-in self-repair solution

Hierarchical, distributed built-in self-repair solution

A built-in self-test (BIST) circuit to test one or more memory blocks on an integrated circuit. The one or more memory blocks further includes a first memory block and a second memory block A built-in soft-repair controller (BISoR) is provided to soft repair the one or more memory blocks. The BIST c...

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Hauptverfasser: ELLUR HARSHARAJ, VARADARAJAN DEVANATHAN, KS RAGHAVENDRA PRASAD
Format: Patent
Sprache:eng
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INFORMATION STORAGE
PHYSICS
STATIC STORES
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creator ELLUR HARSHARAJ
VARADARAJAN DEVANATHAN
KS RAGHAVENDRA PRASAD
description A built-in self-test (BIST) circuit to test one or more memory blocks on an integrated circuit. The one or more memory blocks further includes a first memory block and a second memory block A built-in soft-repair controller (BISoR) is provided to soft repair the one or more memory blocks. The BIST circuit in conjunction with the BISoR is configured to test and soft repair the first memory block before performing test and soft repair of the second memory block.
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subjects INFORMATION STORAGE
PHYSICS
STATIC STORES
title Hierarchical, distributed built-in self-repair solution
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