Semiconductor devices having through-electrodes and methods for fabricating the same
The present inventive concepts provide semiconductor devices and methods for fabricating the same. The method includes forming an inter-metal dielectric layer including a plurality of dielectric layers on a substrate, forming a via-hole vertically penetrating the inter-metal dielectric layer and the...
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creator | HAN KYU-HEE YIM TAEJIN KANG PIL-KYU LEE NAEIN |
description | The present inventive concepts provide semiconductor devices and methods for fabricating the same. The method includes forming an inter-metal dielectric layer including a plurality of dielectric layers on a substrate, forming a via-hole vertically penetrating the inter-metal dielectric layer and the substrate, providing carbon to at least one surface, such as a surface including carbon in the plurality of dielectric layers exposed by the via-hole, forming a via-dielectric layer covering an inner surface of the via-hole, and forming a through-electrode surrounded by the via-dielectric layer in the via-hole. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US9312171B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US9312171B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US9312171B23</originalsourceid><addsrcrecordid>eNqNi7EOgjAURVkcjPoP7wcYCoNx1WjcwZk821vahLakffD9kugHOJ3hnLOv-g7B6xTNoiVlMli9RiHHq48jictpGV2NCVpyMpvhaChAXDKF7HZYfmevWb45qHDAsdpZngpOPx4qetz727PGnAaUmTUiZHh1l1Y16qyuTftH8gF9BzkD</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Semiconductor devices having through-electrodes and methods for fabricating the same</title><source>esp@cenet</source><creator>HAN KYU-HEE ; YIM TAEJIN ; KANG PIL-KYU ; LEE NAEIN</creator><creatorcontrib>HAN KYU-HEE ; YIM TAEJIN ; KANG PIL-KYU ; LEE NAEIN</creatorcontrib><description>The present inventive concepts provide semiconductor devices and methods for fabricating the same. The method includes forming an inter-metal dielectric layer including a plurality of dielectric layers on a substrate, forming a via-hole vertically penetrating the inter-metal dielectric layer and the substrate, providing carbon to at least one surface, such as a surface including carbon in the plurality of dielectric layers exposed by the via-hole, forming a via-dielectric layer covering an inner surface of the via-hole, and forming a through-electrode surrounded by the via-dielectric layer in the via-hole.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160412&DB=EPODOC&CC=US&NR=9312171B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160412&DB=EPODOC&CC=US&NR=9312171B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HAN KYU-HEE</creatorcontrib><creatorcontrib>YIM TAEJIN</creatorcontrib><creatorcontrib>KANG PIL-KYU</creatorcontrib><creatorcontrib>LEE NAEIN</creatorcontrib><title>Semiconductor devices having through-electrodes and methods for fabricating the same</title><description>The present inventive concepts provide semiconductor devices and methods for fabricating the same. The method includes forming an inter-metal dielectric layer including a plurality of dielectric layers on a substrate, forming a via-hole vertically penetrating the inter-metal dielectric layer and the substrate, providing carbon to at least one surface, such as a surface including carbon in the plurality of dielectric layers exposed by the via-hole, forming a via-dielectric layer covering an inner surface of the via-hole, and forming a through-electrode surrounded by the via-dielectric layer in the via-hole.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNi7EOgjAURVkcjPoP7wcYCoNx1WjcwZk821vahLakffD9kugHOJ3hnLOv-g7B6xTNoiVlMli9RiHHq48jictpGV2NCVpyMpvhaChAXDKF7HZYfmevWb45qHDAsdpZngpOPx4qetz727PGnAaUmTUiZHh1l1Y16qyuTftH8gF9BzkD</recordid><startdate>20160412</startdate><enddate>20160412</enddate><creator>HAN KYU-HEE</creator><creator>YIM TAEJIN</creator><creator>KANG PIL-KYU</creator><creator>LEE NAEIN</creator><scope>EVB</scope></search><sort><creationdate>20160412</creationdate><title>Semiconductor devices having through-electrodes and methods for fabricating the same</title><author>HAN KYU-HEE ; YIM TAEJIN ; KANG PIL-KYU ; LEE NAEIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US9312171B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2016</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>HAN KYU-HEE</creatorcontrib><creatorcontrib>YIM TAEJIN</creatorcontrib><creatorcontrib>KANG PIL-KYU</creatorcontrib><creatorcontrib>LEE NAEIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HAN KYU-HEE</au><au>YIM TAEJIN</au><au>KANG PIL-KYU</au><au>LEE NAEIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Semiconductor devices having through-electrodes and methods for fabricating the same</title><date>2016-04-12</date><risdate>2016</risdate><abstract>The present inventive concepts provide semiconductor devices and methods for fabricating the same. The method includes forming an inter-metal dielectric layer including a plurality of dielectric layers on a substrate, forming a via-hole vertically penetrating the inter-metal dielectric layer and the substrate, providing carbon to at least one surface, such as a surface including carbon in the plurality of dielectric layers exposed by the via-hole, forming a via-dielectric layer covering an inner surface of the via-hole, and forming a through-electrode surrounded by the via-dielectric layer in the via-hole.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
title | Semiconductor devices having through-electrodes and methods for fabricating the same |
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