Increasing the dynamic range of an integrator based mutual-capacitance measurement circuit
In one embodiment, a method includes deactivating an integrator of a mutual-capacitive measurement circuit and configuring the mutual-capacitive measurement circuit according to a first voltage configuration. The first voltage configuration results in a charge on a sensor capacitor and a compensatio...
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| creator | HANSSEN INGAR WHELAN RIAN |
| description | In one embodiment, a method includes deactivating an integrator of a mutual-capacitive measurement circuit and configuring the mutual-capacitive measurement circuit according to a first voltage configuration. The first voltage configuration results in a charge on a sensor capacitor and a compensation capacitor when a supply voltage is applied to the mutual-capacitive measurement circuit. The method also includes adjusting a variable reference voltage input of the integrator to a first reference voltage, wherein the first reference voltage is selected to increase an output range of the mutual-capacitive measurement circuit. The method also includes applying the supply voltage to the mutual-capacitive measurement circuit and obtaining a first reference measurement from an analog-digital-converter coupled to an output of the mutual-capacitance measurement circuit. |
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The first voltage configuration results in a charge on a sensor capacitor and a compensation capacitor when a supply voltage is applied to the mutual-capacitive measurement circuit. The method also includes adjusting a variable reference voltage input of the integrator to a first reference voltage, wherein the first reference voltage is selected to increase an output range of the mutual-capacitive measurement circuit. The method also includes applying the supply voltage to the mutual-capacitive measurement circuit and obtaining a first reference measurement from an analog-digital-converter coupled to an output of the mutual-capacitance measurement circuit.</description><language>eng</language><subject>BASIC ELECTRONIC CIRCUITRY ; CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; PULSE TECHNIQUE ; TESTING</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160412&DB=EPODOC&CC=US&NR=9310924B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160412&DB=EPODOC&CC=US&NR=9310924B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HANSSEN INGAR</creatorcontrib><creatorcontrib>WHELAN RIAN</creatorcontrib><title>Increasing the dynamic range of an integrator based mutual-capacitance measurement circuit</title><description>In one embodiment, a method includes deactivating an integrator of a mutual-capacitive measurement circuit and configuring the mutual-capacitive measurement circuit according to a first voltage configuration. The first voltage configuration results in a charge on a sensor capacitor and a compensation capacitor when a supply voltage is applied to the mutual-capacitive measurement circuit. The method also includes adjusting a variable reference voltage input of the integrator to a first reference voltage, wherein the first reference voltage is selected to increase an output range of the mutual-capacitive measurement circuit. The method also includes applying the supply voltage to the mutual-capacitive measurement circuit and obtaining a first reference measurement from an analog-digital-converter coupled to an output of the mutual-capacitance measurement circuit.</description><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>PULSE TECHNIQUE</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjDEOgkAQRWksjHqHuQCJgg2tRqO12tiQcfjgJuws2Z0tvL0UHsDqNe-9ZfG8qkRwcjqQvUHdR9k7ocg6gEJPrOTUMES2EOnFCR35bJnHUnhiccYqID8_coSHGomLkp2ti0XPY8Lmx1VB59P9eCkxhRZpbqGw9nFr6t22qfaHqv5D-QLSZDst</recordid><startdate>20160412</startdate><enddate>20160412</enddate><creator>HANSSEN INGAR</creator><creator>WHELAN RIAN</creator><scope>EVB</scope></search><sort><creationdate>20160412</creationdate><title>Increasing the dynamic range of an integrator based mutual-capacitance measurement circuit</title><author>HANSSEN INGAR ; WHELAN RIAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US9310924B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2016</creationdate><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>PULSE TECHNIQUE</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HANSSEN INGAR</creatorcontrib><creatorcontrib>WHELAN RIAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HANSSEN INGAR</au><au>WHELAN RIAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Increasing the dynamic range of an integrator based mutual-capacitance measurement circuit</title><date>2016-04-12</date><risdate>2016</risdate><abstract>In one embodiment, a method includes deactivating an integrator of a mutual-capacitive measurement circuit and configuring the mutual-capacitive measurement circuit according to a first voltage configuration. The first voltage configuration results in a charge on a sensor capacitor and a compensation capacitor when a supply voltage is applied to the mutual-capacitive measurement circuit. The method also includes adjusting a variable reference voltage input of the integrator to a first reference voltage, wherein the first reference voltage is selected to increase an output range of the mutual-capacitive measurement circuit. The method also includes applying the supply voltage to the mutual-capacitive measurement circuit and obtaining a first reference measurement from an analog-digital-converter coupled to an output of the mutual-capacitance measurement circuit.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRONIC CIRCUITRY CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PULSE TECHNIQUE TESTING |
| title | Increasing the dynamic range of an integrator based mutual-capacitance measurement circuit |
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