Measuring system using optical waveguide, measuring device, measuring method, optical waveguide type sensor chip, and magnetic fine particle

According to one embodiment, a measuring system using an optical waveguide is provided. The measuring system has an optical waveguide, magnetic fine particles, a magnetic field applying unit, a light source and a light receiving element. The optical waveguide has a sensing area to which first substa...

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Bibliographische Detailangaben
Hauptverfasser: NAWATA ISAO, NITTA ISAMU, YAMAUCHI TAKESHI, NAKAYAMA TADAHIRO, KASAI SHINGO, TONO ICHIRO, OOMIYA KAYOKO, HIRAKAWA MASAAKI, TAKASE TOMOHIRO, WADA TAKAAKI
Format: Patent
Sprache:eng
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Zusammenfassung:According to one embodiment, a measuring system using an optical waveguide is provided. The measuring system has an optical waveguide, magnetic fine particles, a magnetic field applying unit, a light source and a light receiving element. The optical waveguide has a sensing area to which first substances having a property of specifically bonding to subject substances to be measured are fixed. Second substances having a property of specifically bonding to the subject substances are fixed to the magnetic fine particle. The magnetic field applying unit generates a magnetic field for moving the magnetic fine particles. The light source inputs a light into the optical waveguide. The light receiving element receives the light output from the optical waveguide.