Built in self-test
A method for testing a DAC including controlling the DAC digitally to cause it to produce a known desired analog output, for example a fixed amplitude sine wave; determining the duration of fixed voltage segments of the actual output of the DAC and using the duration of the fixed voltage segments to...
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | STEVENSON IAN HAMILTON DAVID CLAYTON TOM SHARP GORDON |
description | A method for testing a DAC including controlling the DAC digitally to cause it to produce a known desired analog output, for example a fixed amplitude sine wave; determining the duration of fixed voltage segments of the actual output of the DAC and using the duration of the fixed voltage segments to assess or determine performance of the DAC. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US9246503B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US9246503B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US9246503B13</originalsourceid><addsrcrecordid>eNrjZBByKs3MKVHIzFMoTs1J0y1JLS7hYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxocGWRiZmpgbGTobGRCgBAKKbH3E</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Built in self-test</title><source>esp@cenet</source><creator>STEVENSON IAN ; HAMILTON DAVID ; CLAYTON TOM ; SHARP GORDON</creator><creatorcontrib>STEVENSON IAN ; HAMILTON DAVID ; CLAYTON TOM ; SHARP GORDON</creatorcontrib><description>A method for testing a DAC including controlling the DAC digitally to cause it to produce a known desired analog output, for example a fixed amplitude sine wave; determining the duration of fixed voltage segments of the actual output of the DAC and using the duration of the fixed voltage segments to assess or determine performance of the DAC.</description><language>eng</language><subject>BASIC ELECTRONIC CIRCUITRY ; CODE CONVERSION IN GENERAL ; CODING ; DECODING ; ELECTRICITY</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160126&DB=EPODOC&CC=US&NR=9246503B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160126&DB=EPODOC&CC=US&NR=9246503B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>STEVENSON IAN</creatorcontrib><creatorcontrib>HAMILTON DAVID</creatorcontrib><creatorcontrib>CLAYTON TOM</creatorcontrib><creatorcontrib>SHARP GORDON</creatorcontrib><title>Built in self-test</title><description>A method for testing a DAC including controlling the DAC digitally to cause it to produce a known desired analog output, for example a fixed amplitude sine wave; determining the duration of fixed voltage segments of the actual output of the DAC and using the duration of the fixed voltage segments to assess or determine performance of the DAC.</description><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>CODE CONVERSION IN GENERAL</subject><subject>CODING</subject><subject>DECODING</subject><subject>ELECTRICITY</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBByKs3MKVHIzFMoTs1J0y1JLS7hYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxocGWRiZmpgbGTobGRCgBAKKbH3E</recordid><startdate>20160126</startdate><enddate>20160126</enddate><creator>STEVENSON IAN</creator><creator>HAMILTON DAVID</creator><creator>CLAYTON TOM</creator><creator>SHARP GORDON</creator><scope>EVB</scope></search><sort><creationdate>20160126</creationdate><title>Built in self-test</title><author>STEVENSON IAN ; HAMILTON DAVID ; CLAYTON TOM ; SHARP GORDON</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US9246503B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2016</creationdate><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>CODE CONVERSION IN GENERAL</topic><topic>CODING</topic><topic>DECODING</topic><topic>ELECTRICITY</topic><toplevel>online_resources</toplevel><creatorcontrib>STEVENSON IAN</creatorcontrib><creatorcontrib>HAMILTON DAVID</creatorcontrib><creatorcontrib>CLAYTON TOM</creatorcontrib><creatorcontrib>SHARP GORDON</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>STEVENSON IAN</au><au>HAMILTON DAVID</au><au>CLAYTON TOM</au><au>SHARP GORDON</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Built in self-test</title><date>2016-01-26</date><risdate>2016</risdate><abstract>A method for testing a DAC including controlling the DAC digitally to cause it to produce a known desired analog output, for example a fixed amplitude sine wave; determining the duration of fixed voltage segments of the actual output of the DAC and using the duration of the fixed voltage segments to assess or determine performance of the DAC.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_US9246503B1 |
source | esp@cenet |
subjects | BASIC ELECTRONIC CIRCUITRY CODE CONVERSION IN GENERAL CODING DECODING ELECTRICITY |
title | Built in self-test |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-31T04%3A21%3A17IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=STEVENSON%20IAN&rft.date=2016-01-26&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS9246503B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |