Selectable phase or cycle jitter detector
Embodiments of a jitter detection circuit are disclosed that may allow for detecting both cycle and phase jitter in a clock distribution network. The jitter detection circuit may include a phase selector, a data generator, a delay chain, a logic circuit, and clocked storage elements. The phase selec...
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creator | BURNETTE, II JAMES E HESS GREG M |
description | Embodiments of a jitter detection circuit are disclosed that may allow for detecting both cycle and phase jitter in a clock distribution network. The jitter detection circuit may include a phase selector, a data generator, a delay chain, a logic circuit, and clocked storage elements. The phase selector may be operable to select a clock phase to be used for the launch clock, and the data generator may be operable to generate a data signal responsive to the launch clock. The delay chain may generate a plurality of outputs dependent upon the data signal, and the clocked storage elements may be operable to capture the plurality of outputs from the delay chain, which may be compared to expected data by the logic circuit. |
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The jitter detection circuit may include a phase selector, a data generator, a delay chain, a logic circuit, and clocked storage elements. The phase selector may be operable to select a clock phase to be used for the launch clock, and the data generator may be operable to generate a data signal responsive to the launch clock. The delay chain may generate a plurality of outputs dependent upon the data signal, and the clocked storage elements may be operable to capture the plurality of outputs from the delay chain, which may be compared to expected data by the logic circuit.</description><language>eng</language><subject>BASIC ELECTRONIC CIRCUITRY ; CALCULATING ; CODE CONVERSION IN GENERAL ; CODING ; COMPUTING ; COUNTING ; DECODING ; ELECTRIC COMMUNICATION TECHNIQUE ; ELECTRIC DIGITAL DATA PROCESSING ; ELECTRICITY ; INFORMATION STORAGE ; INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORDCARRIER AND TRANSDUCER ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING ; TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20151208&DB=EPODOC&CC=US&NR=9207705B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20151208&DB=EPODOC&CC=US&NR=9207705B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BURNETTE, II JAMES E</creatorcontrib><creatorcontrib>HESS GREG M</creatorcontrib><title>Selectable phase or cycle jitter detector</title><description>Embodiments of a jitter detection circuit are disclosed that may allow for detecting both cycle and phase jitter in a clock distribution network. The jitter detection circuit may include a phase selector, a data generator, a delay chain, a logic circuit, and clocked storage elements. The phase selector may be operable to select a clock phase to be used for the launch clock, and the data generator may be operable to generate a data signal responsive to the launch clock. 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The jitter detection circuit may include a phase selector, a data generator, a delay chain, a logic circuit, and clocked storage elements. The phase selector may be operable to select a clock phase to be used for the launch clock, and the data generator may be operable to generate a data signal responsive to the launch clock. The delay chain may generate a plurality of outputs dependent upon the data signal, and the clocked storage elements may be operable to capture the plurality of outputs from the delay chain, which may be compared to expected data by the logic circuit.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRONIC CIRCUITRY CALCULATING CODE CONVERSION IN GENERAL CODING COMPUTING COUNTING DECODING ELECTRIC COMMUNICATION TECHNIQUE ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY INFORMATION STORAGE INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORDCARRIER AND TRANSDUCER MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION |
title | Selectable phase or cycle jitter detector |
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