Systems and methods for simultaneously measuring forward and reverse scattering parameters

A system adapted to measure electrical performance of a device under test (DUT) having two or more ports includes a plurality of signal sources synchronized and configured to generated signals simultaneously, a plurality of first signal paths to obtain transmitted and reflected signals from the DUT,...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	BRADLEY DONALD ANTHONY, MARTENS JON S, NOUJEIM KARAM MICHAEL
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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