Reliable readout of fuse data in an integrated circuit
An integrated circuit includes fuse readout logic and first and second sets of fuses. One of the sets includes one or more primary fuses whose burn states represent respective bit values, and the other of the sets includes one or more secondary fuses whose burn states are indicative of the bit value...
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| creator | KASORLA YOAV OJALVO SHAI GURGI EYAL |
| description | An integrated circuit includes fuse readout logic and first and second sets of fuses. One of the sets includes one or more primary fuses whose burn states represent respective bit values, and the other of the sets includes one or more secondary fuses whose burn states are indicative of the bit values stored in the primary fuses. The fuse readout logic is configured to read the bit values by sensing the burn states of the primary fuses, and to conditionally correct the read bit values by sensing the burn states of one or more of the secondary fuses. |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US9136012B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US9136012B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US9136012B13</originalsourceid><addsrcrecordid>eNrjZDALSs3JTEzKSVUoSk1MyS8tUchPU0grLU5VSEksSVTIzFNIzAOSJanpRYklqSkKyZlFyaWZJTwMrGmJOcWpvFCam0HBzTXE2UM3tSA_PrW4IDE5NS-1JD402NLQ2MzA0MjJ0JgIJQAQwSzP</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Reliable readout of fuse data in an integrated circuit</title><source>esp@cenet</source><creator>KASORLA YOAV ; OJALVO SHAI ; GURGI EYAL</creator><creatorcontrib>KASORLA YOAV ; OJALVO SHAI ; GURGI EYAL</creatorcontrib><description>An integrated circuit includes fuse readout logic and first and second sets of fuses. One of the sets includes one or more primary fuses whose burn states represent respective bit values, and the other of the sets includes one or more secondary fuses whose burn states are indicative of the bit values stored in the primary fuses. The fuse readout logic is configured to read the bit values by sensing the burn states of the primary fuses, and to conditionally correct the read bit values by sensing the burn states of one or more of the secondary fuses.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; INFORMATION STORAGE ; PHYSICS ; STATIC STORES</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150915&DB=EPODOC&CC=US&NR=9136012B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25569,76552</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150915&DB=EPODOC&CC=US&NR=9136012B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KASORLA YOAV</creatorcontrib><creatorcontrib>OJALVO SHAI</creatorcontrib><creatorcontrib>GURGI EYAL</creatorcontrib><title>Reliable readout of fuse data in an integrated circuit</title><description>An integrated circuit includes fuse readout logic and first and second sets of fuses. One of the sets includes one or more primary fuses whose burn states represent respective bit values, and the other of the sets includes one or more secondary fuses whose burn states are indicative of the bit values stored in the primary fuses. The fuse readout logic is configured to read the bit values by sensing the burn states of the primary fuses, and to conditionally correct the read bit values by sensing the burn states of one or more of the secondary fuses.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>INFORMATION STORAGE</subject><subject>PHYSICS</subject><subject>STATIC STORES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2015</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDALSs3JTEzKSVUoSk1MyS8tUchPU0grLU5VSEksSVTIzFNIzAOSJanpRYklqSkKyZlFyaWZJTwMrGmJOcWpvFCam0HBzTXE2UM3tSA_PrW4IDE5NS-1JD402NLQ2MzA0MjJ0JgIJQAQwSzP</recordid><startdate>20150915</startdate><enddate>20150915</enddate><creator>KASORLA YOAV</creator><creator>OJALVO SHAI</creator><creator>GURGI EYAL</creator><scope>EVB</scope></search><sort><creationdate>20150915</creationdate><title>Reliable readout of fuse data in an integrated circuit</title><author>KASORLA YOAV ; OJALVO SHAI ; GURGI EYAL</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US9136012B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2015</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>INFORMATION STORAGE</topic><topic>PHYSICS</topic><topic>STATIC STORES</topic><toplevel>online_resources</toplevel><creatorcontrib>KASORLA YOAV</creatorcontrib><creatorcontrib>OJALVO SHAI</creatorcontrib><creatorcontrib>GURGI EYAL</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KASORLA YOAV</au><au>OJALVO SHAI</au><au>GURGI EYAL</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Reliable readout of fuse data in an integrated circuit</title><date>2015-09-15</date><risdate>2015</risdate><abstract>An integrated circuit includes fuse readout logic and first and second sets of fuses. One of the sets includes one or more primary fuses whose burn states represent respective bit values, and the other of the sets includes one or more secondary fuses whose burn states are indicative of the bit values stored in the primary fuses. The fuse readout logic is configured to read the bit values by sensing the burn states of the primary fuses, and to conditionally correct the read bit values by sensing the burn states of one or more of the secondary fuses.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE PHYSICS STATIC STORES |
| title | Reliable readout of fuse data in an integrated circuit |
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