Apparatus and method for measuring a delay

An apparatus and method for measuring a delay. The apparatus for measuring a delay includes an overhead inserting unit configured to inserting a time stamp into an overhead of a multiframe to be transmitted from a first location to a second location; an overhead extracting unit configured to extract...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: KIM JONG-HO, SHIN JONGYOON, YOUN JI-WOOK
Format: Patent
Sprache:eng
Schlagworte:
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