Tire defect detection method

Provided is a tire defect detection method capable of accurately detecting a thinly extending convex defect of a tire surface. Prior to the start of Step S1, two-dimensional images including a slit light image are successively obtained in advance. In Step S1, a slit light image is extracted from dat...

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Bibliographische Detailangaben
Hauptverfasser:	FUJIWARA TAKAYUKI, IWATANI TOSHIHIKO, KOSHIMIZU HIROYASU, IMADA MUNETOSHI, MIZUKUSA HIROKATSU
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING HANDLING RECORD CARRIERS IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS PRESENTATION OF DATA RECOGNITION OF DATA RECORD CARRIERS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	Provided is a tire defect detection method capable of accurately detecting a thinly extending convex defect of a tire surface. Prior to the start of Step S1, two-dimensional images including a slit light image are successively obtained in advance. In Step S1, a slit light image is extracted from data of a plurality of shot two-dimensional images. In Step S2, an eccentricity component which is deviation resulting from eccentricity is eliminated from the extracted slit light image. In Step S3, a feature quantity is calculated based on the light image from which the eccentricity component is eliminated, and in Step S4, a thinly extending convex defect is detected based on the calculated feature quantity.