Jig for measuring EMC of semiconductor chip and method for measuring EMC of semiconductor chip using the same

Disclosed are a jig for measuring EMC of a semiconductor chip and a method for measuring EMC that can accurately measure the EMC at a semiconductor chip level. The jig for measuring EMC of a semiconductor chip according to the exemplary embodiment of the present disclosure includes: a chip mount uni...

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Bibliographische Detailangaben
1. Verfasser: YEO SOON IL
Format: Patent
Sprache:eng
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