Optic instrument with wavefront analyser
In the field of optic instruments comprising at least one optical architecture, a photoreception assembly and means for acquisition and analysis of the images arising from the said photoreception assembly, the acquisition and analysis means comprising an algorithm of phase diversity type, an optical...
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creator | FALZON FRÉDÉRIC PERRIN GUILLAUME LIOTARD ARNAUD BERNOT MARC |
description | In the field of optic instruments comprising at least one optical architecture, a photoreception assembly and means for acquisition and analysis of the images arising from the said photoreception assembly, the acquisition and analysis means comprising an algorithm of phase diversity type, an optical architecture comprises an optical plate of low or zero optical power arranged in the vicinity of the photoreception assembly and disposed so as to form on all or part of the said assembly a first focused image and a second image defocused by a first predetermined value and shifted by a second predetermined value with respect to the first image. The optic instrument can advantageously be a space telescope. |
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The optic instrument can advantageously be a space telescope.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; COLORIMETRY ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150505&DB=EPODOC&CC=US&NR=9024239B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150505&DB=EPODOC&CC=US&NR=9024239B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>FALZON FRÉDÉRIC</creatorcontrib><creatorcontrib>PERRIN GUILLAUME</creatorcontrib><creatorcontrib>LIOTARD ARNAUD</creatorcontrib><creatorcontrib>BERNOT MARC</creatorcontrib><title>Optic instrument with wavefront analyser</title><description>In the field of optic instruments comprising at least one optical architecture, a photoreception assembly and means for acquisition and analysis of the images arising from the said photoreception assembly, the acquisition and analysis means comprising an algorithm of phase diversity type, an optical architecture comprises an optical plate of low or zero optical power arranged in the vicinity of the photoreception assembly and disposed so as to form on all or part of the said assembly a first focused image and a second image defocused by a first predetermined value and shifted by a second predetermined value with respect to the first image. 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The optic instrument can advantageously be a space telescope.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS COLORIMETRY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY SEMICONDUCTOR DEVICES TESTING |
title | Optic instrument with wavefront analyser |
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