Methods for correcting for thermal drift in microscopy images
Methods for correcting for thermal drift in microscopy images are described. One such method includes receiving an original image for correction, the original image having been generated using microscopy, receiving information indicative of a feature selected from within the original image by a user...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | LEARY SEAN P |
| description | Methods for correcting for thermal drift in microscopy images are described. One such method includes receiving an original image for correction, the original image having been generated using microscopy, receiving information indicative of a feature selected from within the original image by a user, the selected feature including an edge, storing the original image in a database including a plurality of images, each having one or more features, correlating the selected feature with one of the one or more features stored in the database to identify a first plurality of points defining the edge, removing one or more points of the first plurality of points using an outlier rejection technique, generating a smoothing spline approximation for a second plurality of points defining the edge, and generating a corrected image by shifting points of the original image in accordance with the smoothing spline approximation. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US8989511B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US8989511B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US8989511B13</originalsourceid><addsrcrecordid>eNrjZLD1TS3JyE8pVkjLL1JIzi8qSk0uycxLB3NLMlKLchNzFFKKMtNKFDLzFHIzk4vyi5PzCyoVMnMT01OLeRhY0xJzilN5oTQ3g4Kba4izh25qQX58anFBYnJqXmpJfGiwhaWFpamhoZOhMRFKANntMDM</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Methods for correcting for thermal drift in microscopy images</title><source>esp@cenet</source><creator>LEARY SEAN P</creator><creatorcontrib>LEARY SEAN P</creatorcontrib><description>Methods for correcting for thermal drift in microscopy images are described. One such method includes receiving an original image for correction, the original image having been generated using microscopy, receiving information indicative of a feature selected from within the original image by a user, the selected feature including an edge, storing the original image in a database including a plurality of images, each having one or more features, correlating the selected feature with one of the one or more features stored in the database to identify a first plurality of points defining the edge, removing one or more points of the first plurality of points using an outlier rejection technique, generating a smoothing spline approximation for a second plurality of points defining the edge, and generating a corrected image by shifting points of the original image in accordance with the smoothing spline approximation.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; HANDLING RECORD CARRIERS ; PHYSICS ; PRESENTATION OF DATA ; RECOGNITION OF DATA ; RECORD CARRIERS</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150324&DB=EPODOC&CC=US&NR=8989511B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150324&DB=EPODOC&CC=US&NR=8989511B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LEARY SEAN P</creatorcontrib><title>Methods for correcting for thermal drift in microscopy images</title><description>Methods for correcting for thermal drift in microscopy images are described. One such method includes receiving an original image for correction, the original image having been generated using microscopy, receiving information indicative of a feature selected from within the original image by a user, the selected feature including an edge, storing the original image in a database including a plurality of images, each having one or more features, correlating the selected feature with one of the one or more features stored in the database to identify a first plurality of points defining the edge, removing one or more points of the first plurality of points using an outlier rejection technique, generating a smoothing spline approximation for a second plurality of points defining the edge, and generating a corrected image by shifting points of the original image in accordance with the smoothing spline approximation.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>HANDLING RECORD CARRIERS</subject><subject>PHYSICS</subject><subject>PRESENTATION OF DATA</subject><subject>RECOGNITION OF DATA</subject><subject>RECORD CARRIERS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2015</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLD1TS3JyE8pVkjLL1JIzi8qSk0uycxLB3NLMlKLchNzFFKKMtNKFDLzFHIzk4vyi5PzCyoVMnMT01OLeRhY0xJzilN5oTQ3g4Kba4izh25qQX58anFBYnJqXmpJfGiwhaWFpamhoZOhMRFKANntMDM</recordid><startdate>20150324</startdate><enddate>20150324</enddate><creator>LEARY SEAN P</creator><scope>EVB</scope></search><sort><creationdate>20150324</creationdate><title>Methods for correcting for thermal drift in microscopy images</title><author>LEARY SEAN P</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US8989511B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2015</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>HANDLING RECORD CARRIERS</topic><topic>PHYSICS</topic><topic>PRESENTATION OF DATA</topic><topic>RECOGNITION OF DATA</topic><topic>RECORD CARRIERS</topic><toplevel>online_resources</toplevel><creatorcontrib>LEARY SEAN P</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LEARY SEAN P</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Methods for correcting for thermal drift in microscopy images</title><date>2015-03-24</date><risdate>2015</risdate><abstract>Methods for correcting for thermal drift in microscopy images are described. One such method includes receiving an original image for correction, the original image having been generated using microscopy, receiving information indicative of a feature selected from within the original image by a user, the selected feature including an edge, storing the original image in a database including a plurality of images, each having one or more features, correlating the selected feature with one of the one or more features stored in the database to identify a first plurality of points defining the edge, removing one or more points of the first plurality of points using an outlier rejection technique, generating a smoothing spline approximation for a second plurality of points defining the edge, and generating a corrected image by shifting points of the original image in accordance with the smoothing spline approximation.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US8989511B1 |
| source | esp@cenet |
| subjects | CALCULATING COMPUTING COUNTING HANDLING RECORD CARRIERS PHYSICS PRESENTATION OF DATA RECOGNITION OF DATA RECORD CARRIERS |
| title | Methods for correcting for thermal drift in microscopy images |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-03T23%3A38%3A03IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=LEARY%20SEAN%20P&rft.date=2015-03-24&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS8989511B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |