Methods of stripping resist after metal deposition

In accordance with an embodiment of the present invention, a method of forming a semiconductor device includes forming a seed layer over a dielectric layer and a patterned resist layer over the seed layer. Next, metal lines are formed on regions of the seed layer not covered by the patterned resist...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: STEGEMANN MAIK
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!