Current source circuits and methods for mass write and testing of programmable impedance elements

An integrated circuit device can include a plurality of memory cells, each including at least one element programmable between different impedance states by application of a voltage or current; a plurality of bit line groups, each bit line group including multiple bit lines, each bit line being coup...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: HOLLMER SHANE CHARLES, DINH JOHN
Format: Patent
Sprache:eng
Schlagworte:
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