Lithographic apparatus and method

In a lithographic apparatus, a slip of a patterning device relative to a support, the support constructed to support the patterning device, may be provided by measuring a position of the support relative to a first structure of the lithographic apparatus; measuring a position of the patterning devic...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: LOOPSTRA ERIK ROELOF, ONVLEE JOHANNES
Format: Patent
Sprache:eng
Schlagworte:
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