Oxide removal by remote plasma treatment with fluorine and oxygen radicals

Oxides (e.g., native or thermal silicon oxide) are etched from underlying silicon with a mixture of fluorine and oxygen radicals generated by a remote plasma. The oxygen radicals rapidly oxidize any uncovered bare silicon areas, preventing the pitting that can result from fluorine etching bare silic...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SU JINGANG, WATANABE J, BODKE ASHISH, PETHE ABHIJIT
Format: Patent
Sprache:eng
Schlagworte:
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