Extending flash memory data retension via rewrite refresh

Providing for extended data retention of flash memory devices by program state rewrite is disclosed herein. By way of example, a memory cell or group of memory cells can be evaluated to determine a program state of the cell(s). If the cell(s) is in a program state, as opposed to a natural or non-pro...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: DARLING DON CARLOS, RANDOLPH MARK W, HAMILTON DARLENE G, KORNITZ RON
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator DARLING DON CARLOS
RANDOLPH MARK W
HAMILTON DARLENE G
KORNITZ RON
description Providing for extended data retention of flash memory devices by program state rewrite is disclosed herein. By way of example, a memory cell or group of memory cells can be evaluated to determine a program state of the cell(s). If the cell(s) is in a program state, as opposed to a natural or non-programmed state, a charge level, voltage level and/or the like can be rewritten to a default level associated with the program state, without erasing the cell(s) first. Accordingly, conventional mechanisms for refreshing cell program state that require rewriting and erasing, typically degrading storage capacity of the memory cell, can be avoided. As a result, data stored in flash memory can be refreshed in a manner that mitigates loss of memory integrity, providing substantial benefits over conventional mechanisms that can degrade memory integrity at a relatively high rate.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US8938655B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US8938655B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US8938655B23</originalsourceid><addsrcrecordid>eNrjZLB0rShJzUvJzEtXSMtJLM5QyE3NzS-qVEhJLElUKEoFyhVn5ucplGWCeOVFmSWpQDqtKLU4g4eBNS0xpziVF0pzMyi4uYY4e-imFuTHpxYXJCan5qWWxIcGW1gaW5iZmjoZGROhBAAMDy7Z</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Extending flash memory data retension via rewrite refresh</title><source>esp@cenet</source><creator>DARLING DON CARLOS ; RANDOLPH MARK W ; HAMILTON DARLENE G ; KORNITZ RON</creator><creatorcontrib>DARLING DON CARLOS ; RANDOLPH MARK W ; HAMILTON DARLENE G ; KORNITZ RON</creatorcontrib><description>Providing for extended data retention of flash memory devices by program state rewrite is disclosed herein. By way of example, a memory cell or group of memory cells can be evaluated to determine a program state of the cell(s). If the cell(s) is in a program state, as opposed to a natural or non-programmed state, a charge level, voltage level and/or the like can be rewritten to a default level associated with the program state, without erasing the cell(s) first. Accordingly, conventional mechanisms for refreshing cell program state that require rewriting and erasing, typically degrading storage capacity of the memory cell, can be avoided. As a result, data stored in flash memory can be refreshed in a manner that mitigates loss of memory integrity, providing substantial benefits over conventional mechanisms that can degrade memory integrity at a relatively high rate.</description><language>eng</language><subject>INFORMATION STORAGE ; PHYSICS ; STATIC STORES</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20150120&amp;DB=EPODOC&amp;CC=US&amp;NR=8938655B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20150120&amp;DB=EPODOC&amp;CC=US&amp;NR=8938655B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>DARLING DON CARLOS</creatorcontrib><creatorcontrib>RANDOLPH MARK W</creatorcontrib><creatorcontrib>HAMILTON DARLENE G</creatorcontrib><creatorcontrib>KORNITZ RON</creatorcontrib><title>Extending flash memory data retension via rewrite refresh</title><description>Providing for extended data retention of flash memory devices by program state rewrite is disclosed herein. By way of example, a memory cell or group of memory cells can be evaluated to determine a program state of the cell(s). If the cell(s) is in a program state, as opposed to a natural or non-programmed state, a charge level, voltage level and/or the like can be rewritten to a default level associated with the program state, without erasing the cell(s) first. Accordingly, conventional mechanisms for refreshing cell program state that require rewriting and erasing, typically degrading storage capacity of the memory cell, can be avoided. As a result, data stored in flash memory can be refreshed in a manner that mitigates loss of memory integrity, providing substantial benefits over conventional mechanisms that can degrade memory integrity at a relatively high rate.</description><subject>INFORMATION STORAGE</subject><subject>PHYSICS</subject><subject>STATIC STORES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2015</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLB0rShJzUvJzEtXSMtJLM5QyE3NzS-qVEhJLElUKEoFyhVn5ucplGWCeOVFmSWpQDqtKLU4g4eBNS0xpziVF0pzMyi4uYY4e-imFuTHpxYXJCan5qWWxIcGW1gaW5iZmjoZGROhBAAMDy7Z</recordid><startdate>20150120</startdate><enddate>20150120</enddate><creator>DARLING DON CARLOS</creator><creator>RANDOLPH MARK W</creator><creator>HAMILTON DARLENE G</creator><creator>KORNITZ RON</creator><scope>EVB</scope></search><sort><creationdate>20150120</creationdate><title>Extending flash memory data retension via rewrite refresh</title><author>DARLING DON CARLOS ; RANDOLPH MARK W ; HAMILTON DARLENE G ; KORNITZ RON</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US8938655B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2015</creationdate><topic>INFORMATION STORAGE</topic><topic>PHYSICS</topic><topic>STATIC STORES</topic><toplevel>online_resources</toplevel><creatorcontrib>DARLING DON CARLOS</creatorcontrib><creatorcontrib>RANDOLPH MARK W</creatorcontrib><creatorcontrib>HAMILTON DARLENE G</creatorcontrib><creatorcontrib>KORNITZ RON</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>DARLING DON CARLOS</au><au>RANDOLPH MARK W</au><au>HAMILTON DARLENE G</au><au>KORNITZ RON</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Extending flash memory data retension via rewrite refresh</title><date>2015-01-20</date><risdate>2015</risdate><abstract>Providing for extended data retention of flash memory devices by program state rewrite is disclosed herein. By way of example, a memory cell or group of memory cells can be evaluated to determine a program state of the cell(s). If the cell(s) is in a program state, as opposed to a natural or non-programmed state, a charge level, voltage level and/or the like can be rewritten to a default level associated with the program state, without erasing the cell(s) first. Accordingly, conventional mechanisms for refreshing cell program state that require rewriting and erasing, typically degrading storage capacity of the memory cell, can be avoided. As a result, data stored in flash memory can be refreshed in a manner that mitigates loss of memory integrity, providing substantial benefits over conventional mechanisms that can degrade memory integrity at a relatively high rate.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US8938655B2
source esp@cenet
subjects INFORMATION STORAGE
PHYSICS
STATIC STORES
title Extending flash memory data retension via rewrite refresh
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-25T10%3A19%3A59IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=DARLING%20DON%20CARLOS&rft.date=2015-01-20&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS8938655B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true